研究生: |
張晏維 Yen-Wei Chang |
---|---|
論文名稱: |
金屬玻璃與無鉛銲料界面反應之研究 The Investigation of Interfacial Reactions between Bulk Metallic Glass and Lead-free Solders |
指導教授: |
顏怡文
Yee-wen Yen |
口試委員: |
朱瑾
Jinn Chu 陳志銘 Chih-ming Chen |
學位類別: |
碩士 Master |
系所名稱: |
工程學院 - 材料科學與工程系 Department of Materials Science and Engineering |
論文出版年: | 2016 |
畢業學年度: | 104 |
語文別: | 中文 |
論文頁數: | 68 |
中文關鍵詞: | 塊材金屬玻璃 、無鉛銲料 、界面反應 、擴散層 |
外文關鍵詞: | BMG, lead-free solder, Interfacial reaction, diffusion layer |
相關次數: | 點閱:402 下載:7 |
分享至: |
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
為提高金屬玻璃於工業之應用,首要克服的問題就是如何將金屬玻璃接合於異質材料。本研究以銅模鑄造法製備Cu-45Zr-5Al-5Ag塊材金屬玻璃。對此塊材金屬玻璃先於表面作噴砂前處理、表面再輔以濺鍍銅與電鍍銅之處理,最後以純錫(Sn)、錫-3.0銀-0.5銅(SAC305)兩種銲料作為接合材料與銅基材進行接合。研究結果發現,兩種銲料在接合界面皆可觀察到Cu6Sn5與Cu3Sn相之生成。在純錫銲料中,會有微小孔洞的生成,並且隨著錫原子持續擴散,逐漸在純錫銲料與Cu6Sn5相間生成Kirkendall孔洞。而在錫-3.0銀-0.5銅銲料中,可以觀察到Ag3Sn相之生成,因為Ag3Sn相的生成填補銲料因擴散而生成的孔洞,且Ag3Sn相會隨著時效時間增長而粗大化。此外,在Cu-45Zr-5Al-5Ag塊材金屬玻璃與鍍銅層間可觀察到一擴散層,其主要組成為ZrO2。且該擴散層之厚度隨時效時間增長而增厚。
Bulk metallic glass (BMG) has different mechanical, electrical, magnetic, chemical and physical properties from the general polycrystalline alloy because the internal arrangement of atoms is random. Thus, BMG has well mechanical strength, high hardness, wear resistance, corrosion resistance, and good surface smoothness. Based on these features, BMG has a very promising future in industry. However, for the application of BMG in industrial production, the main problem is how to overcome the joining with other materials. The present study focuses on the soldering processing, with low operating temperature to avoid exceeding the recrystallization temperature. Using lead-free solder and heat press treatment, this study developed a feasible joining process between BMG and copper.
In this study, a copper mold casting method was utilized to prepare Cu45Zr45Al5Ag5 BMG. The BMG surface was applied surface finish and pre-plated copper (5 m) as a wetting layer. The lead-free solder layer was used as a joining material. The reaction temperature was set between the glass transition temperature (Tg) of BMG and the melting point of the solder. After the reflowing and aging process, the joint sample was examined by SEM to observe the interface morphology; the composition was utilized EDS and EPMA to observe; XRD and XPS was used to determine the phase in diffusion layer. TEM was utilized to observe the micro-structure of the joints. It was found that Cu-Zr based BMG can be joined with Cu substrate successfully after the surface finish and plated Cu on the BMG surface. And between the BMG and plated Cu, a diffusion layer was observed and the thickness was increased with longer aging time, which belongs to diffusion controlled of the interfacial reaction. The main component of the diffusion layer are ZrO2 and Cu-rich region. Because of the higher formation rate of ZrO2, the Cu-rich region was peeled and dispersed in ZrO2 phase.
[1] J. T. Lue, Journal of Physics and Chemistry of Solids, 62 (2001) 1599-1612.
[2] C. C. Hays, C. P. Kim, W. L. Johnson, Physical Review Letters, 84 (2000) 2901.
[3] M. Chen, A. Inoue, W. Zhang, and T. Sakurai, Physical Review Letters, 96 (2006) 245502.
[4] E. Park, D. Kim, Metals and Materials International, 11 (2005) 19-27.
[5] C. L. Qin, W. Zhang, K. Asami, H. Kimura, X. M. Wang, A. Inoue, Acta Materialia, 54 (2006) 3713-3719.
[6] H. S. Shin, Y. J. Jeong, H. Y. Choi, H. Kato, A. Inoue, Journal of Alloys and Compounds, 434 (2007) 102-105.
[7] A. Inoue, A. Takeuchi, Acta Materialia, 59 (2011) 2243-2267.
[8] B. J. Yang, J. H. Yao, J. Zhang, H. W. Yang, J. Q. Wang, E. Ma, Scripta Materialia, 61 (2009) 423-426.
[9] S. Jana, R. Bhowmick, Y. Kawamura, K. Chattopadhyay, U. Ramamurty, Intermetallics, 12 (2004) 1097-1102.
[10] M. Telford, Materials Today, 7 (2004) 36-43.
[11] A. Inoue, N. Nishiyama, Mrs Bulletin, 32 (2007) 651-658.
[12] J. K. Lee, H. J. Kim, T. S. Kim, S. Y. Shin, Y. C. Kim, J. C. Bae, Journal of Materials Processing Technology, 187 (2007) 801-804.
[13] 棚次悠介, 金屬玻璃薄膜應用於醫用針頭之性質提升研究, 國立臺灣科技大學材料科學與工程所碩士論文, 民國104年.
[14] A. Takeuchi, A. Inoue, Materials Transactions, 46 (2005) 2817-2829.
[15] 惠希東, 陳國良, 塊體非晶質合金, 化學工業出版社, (2007) 40.
[16] Z. P. Lu, C. T. Liu, Physical Review Letters, 91 (2003) 115505.
[17] Mc. J. Weinberg, Non-Crystalline Solids 167 (1994) 81-88.
[18] S. Joseph Poon, Gary J. Shiflet, F. Q. Guo, V. Ponnambalam, Journal of Non-Crystalline Solids, 317 (2003) 1-9.
[19] J. Schroers, Q. Pham, A. Desai, Journal of Microelectromechanical Systems, 16 (2007) 240-247.
[20] H. Men, D. Kim, Journal of Materials Research, 18 (2003) 1502-1504.
[21] H. J. Kim , K. M. Lim, B. G. Seong, C. G. Park, Journal of Materials Science, 36 (2001) 49-54.
[22] J. Hosko, I. Janotova, P. Svec, D. Janickovic, G. Vlasak, E. Illekova, I. Matko, P. Svec Sr., Journal of Non-Crystalline Solids, 358 (2012) 1545-1549.
[23] S. C. Juang, Y. S. Tarng, Journal of Materials Processing Technology, 122 (2002) 33-37.
[24] V. Gunaraj, N. Murugan, Journal of Materials Processing Technology, 88 (1999) 266-275.
[25] S. Aslanlar, Materials and Design, 27 (2006) 125-131.
[26] H. Kreye, Welding Journal, 56 (1977) 154-158.
[27] E. V. Locke, E. D. Hoag, R. A. Hella, IEEE Journal of Quantum Electronics, 8 (1972) 132-135.
[28] W. Hanson, K. Ironside, J. Fernie, Acta Materialia, 48 (2000) 4673-4676.
[29] R. K. Wassink, Electrochemical Publications (1984)
[30] K. H. Tseng, G. Kohn, Y. Greenberg, I. Makover and A. Munitz, Laser-Assisted Friction Stir Welding, American Welding Society (2002)
[31] J. G. Lee, Y. H. Choi, J. K. Lee, G. J. Lee, M. K. Lee, C. K. Rhee, Intermetallics, 18 (2010) 70-73.
[32] Mikell P. Groover, Fundamentals of Modern Manufacturing, John Wiley & Sons (2010)
[33] M. M. Schwartz, Brazing, ASM International, Materials Park, Ohio, USA (1987) 116-125.
[34] P. Roberts, Industrial Brazing Practice, CRC Press (2013).
[35] J. Kim, Y. Kawamura, Journal of Materials Processing Technology, 207 (2008) 112-117.
[36] S. Tamura , Y. Tsunekawa, M. Okumiya, M. Hatakeyama, Journal of Materials Processing Technology, 206 (2008) 322-327.
[37] C. L. Tsao, S. W. Chen, Journal of Materials Science, 30 (1995) 5215-5222.
[38] 黃育智, 不同尺寸電子銲點中之相生成與相變化, 清華大學化學工程所博士論文, 民國99年.
[39] W. Zhang, F. Jia, Q. S. Zhang, A. Inoue, Materials Science and Engineering, 459 (2007) 330-336.
[40] 李澄傑, 微接點中因界面反應引發之體積收縮行為, 國立臺灣大學材料科學與工程所博士論文, 民國103年.
[41] T. Lyman, Metals Handbook 8th edn., Vol. 8, Metallography, Structures and Phase Diagrams , ASM International, Metal Park, Ohio, USA (1973) 269.
[42] D. R. Frear, S. N. Burchett, H. S. Morgan, J. H. Lau, The Mechanics of Solder Alloy Interconnects, Springer, New York, USA (1994) 76.
[43] M. Oh, Doctoral Dissertation, Leihigh University, USA (1994).
[44] M. Onishi, H. Fujibuchi, Transactions of the Japan Institute of Metals, 16 (1975) 539.
[45] H. Y. Chuang, J. J. Yu, M. S. Kuo, H. M. Tong, C. R. Kao, Scripta Materialia, 66 (2012) 171-174.
[46] 余人睿, 三維積體電路微接點中介金屬作為結構材之應用, 國立臺灣大學材料科學與工程所博士論文, 民國105年.
[47] W. Kai, I. F. Ren, P. C. Kao, R. F. Wang, C. P. Chuang, Matthew W. Freels, Peter K. Liaw, Advanced Engineering Materials, 11 (2009) 380-386.
[48] J. Moulder, Handbook of X-ray Photoelectron Spectroscopy, Physical Electronics (1995).
[49] T. L. Barr, The Journal of Physical Chemistry, 82 (1978) 1801-1810.
[50] C. C. Fulton, T. E. Cook Jr., G. Lucovsky, R. J. Nemanich, Journal of Applied Physics, 96 (2004) 2665-2673.
[51] C. Hinnen, D. Imbert, J. M. Siffre, P. Marcus, Applied Surface Science, 78 (1994) 219-231.
[52] P. J. Cumpson, M. P. Seah, Surface and Interface Analysis, 25 (1997) 430-446.
[53] C. D. Wagner, Journal of Vacuum Science & Technology, 15 (1978) 518-523.
[54] D. Briggs, M. P. Seah, Practical surface analysis by Auger and X-ray photoelectron spectroscopy, John Wiley & Sons, New Jersey, USA (1983).
[55] S. Maroie, G. Haemers, J. Verbist, Applications of Surface Science, 17 (1984) 463-467.
[56] J. Agrell, M. Boutonnet, José L. G. Fierro, Applied Catalysis A: General, 253 (2003) 201-211.