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研究生: 孫國育
SUN,KUO-YU
論文名稱: 基於生成對抗神經網路與自動光學檢測之藥錠瑕疵檢測
Pills Defect Detection Based on Generative Adversarial Networks and Automatic Optical Inspection
指導教授: 林其禹
Chyi-Yeu Lin
口試委員: 林柏廷
Po-Ting Lin
林遠球
Yuan-Chiu Lin
學位類別: 碩士
Master
系所名稱: 工程學院 - 機械工程系
Department of Mechanical Engineering
論文出版年: 2019
畢業學年度: 107
語文別: 中文
論文頁數: 79
中文關鍵詞: 深度學習類神經網路卷積類神經網路生成對抗網路電腦視覺自動光學檢測瑕疵檢測
外文關鍵詞: deep learning, neural network, convolutional neural network, generative adversarial network, computer vision, automatic optical inspection, defect detection
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台灣製藥產業對於藥錠的表面瑕疵檢測多以人力進行檢測,利用人工檢測的方式不但缺乏時間效率,且容易有不穩定及誤判之問題。近年來深度學習的發展快速,使得神經網路也逐漸應用在許多領域。如想基於卷積神經網路(Convolutional Neural Networks, CNN)為主軸架構來執行瑕疵檢測,則須提供足夠數量的缺陷樣本才能達到理想的訓練目標。惟缺陷充分樣本很難克服,且需花費大量時間對瑕疵做人工標記動作。
本論文研究使用生成對抗網路(Generative Adversarial Network, GAN),僅使用正常藥錠表面影像的情況下來進行神經網路模型訓練,同時引進Wasserstein GAN(Wasserstein Generative Adversarial Networks, WGAN)和自編碼器(Autoencoder)來重新建構一個用於影像重建的生成對抗網路,藉由比較影像重建的前後來達成瑕疵檢測。由於生成對抗網路對於較小面積瑕疵的誤判率較高,因此本研究針對黑點瑕疵,也提出利用傳統光學檢測進行檢測的演算法。一系列的實驗證實本研究提出的演算法能夠發揮很高的瑕疵檢出率。


In Taiwan, pharmaceutical industries generally inspect surface of tablets for defects manually. This will result in not only time-consuming but also undesirable misjudgments. In recent years, due to the fast development of deep learning, Neural Network has been applied to more and more fields. In order to train the Convolutional Neural Networks for the usage of defects detection, a large number of defective samples have to be provided. However, it is very difficult to collect enough defective samples, and it also takes enormous amount of time to mark the defects manually.
This research makes use of Generative Adversarial Network(GAN) to train the neural network model by only providing images of normal tablets. At the same time, Wasserstein Generative Adversarial Network(WGAN) and Autoencoder are used to rebuild a GAN for image reconstruction, comparing the image before and after reconstruction to detect the defects. Because of GAN fails to detect small defect area, this research also implements traditional optical inspection techniques to inspect the defect of black spots. A series of experiments proves that the algorithms developed in this thesis is able to give high defect inspection rate.

摘要......i Abstract......ii 誌謝......iii 目錄......iv 圖目錄......vi 表目錄......viii 第一章 緒論......1 1-1 前言......1 1-2 研究動機與目的......2 1-3 文獻回顧......3 1-4 本文架構......3 第二章 研究基礎理論......5 2-1 多層感知器(Multilayer Perceptron, MLP)......5 2-1-1 反向傳播演算法(Back Propagation)......7 2-1-2 激活函數(Activation Functions)......13 2-1-3 損失函數(Loss Function)......15 2-1-4 梯度下降法(Gradient Descent)......16 2-2 卷積神經網路(Convolution Neural Network, CNN)......18 2-2-1 卷積層(Convolutional Layer)......19 2-2-2 池化層(Pooling Layer)......21 2-2-3 全連接層(Fully-Connected Layer)......22 2-3 轉置卷積(Transposed Convolution)......23 2-4 生成對抗網路(Generative Adversarial Network, GAN)......23 2-5 WGAN(Wasserstein Generative Adversarial Network)......25 2-5-1 WGAN-GP(WGAN-Gradient Penalty)......29 2-6 自編碼器(Autoencoder)......31 2-7 批次標準化(Batch Normalization)......32 2-8 影像處理方法......34 2-8-1 影像二值化......34 2-8-2 形態學(Morphology)......35 2-8-3 圓偵測......36 2-8-4 邊緣偵測......37 2-9 影像擷取系統......37 第三章 研究方法設計......39 3-1 檢測系統環境設計......39 3-1-1 缺角瑕疵檢測光源系統......40 3-1-2 黑點瑕疵檢測光源系統......41 3-2 生成對抗網路瑕疵檢測架構......42 3-2-1 生成對抗網路架構......42 3-2-2 影像重建網路架構與訓練......44 3-2-3 數據增強(Data Augmentation)......47 3-3 自動光學瑕疵檢測架構......48 3-3-1 表面黑點檢測演算法......48 第四章 實驗結果與分析......51 4-1 實驗設備......51 4-1-1 工業相機......51 4-1-2 實驗開發環境......52 4-1-3 硬體設備架構......52 4-2 生成對抗網路瑕疵檢測實驗說明......54 4-3 自動光學瑕疵檢測實驗說明......61 第五章 結論與未來展望......65 5-1 結論......65 5-2 未來展望......66 參考文獻......67

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