研究生: |
OKI SUPRADA OKI SUPRADA OMPUSUNGGU |
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論文名稱: |
以攝影測量方式分析多光譜三維微尺度微粒循跡測速儀之光學系統特徵 Optical Characterization of a Multi-Spectral 3D Micro Particle Tracking Velocimetry System by Photogrammetric Approach |
指導教授: |
田維欣
Wei-Hsin Tien |
口試委員: |
林怡均
Yi-Jiun LIN 蘇裕軒 Yu-Hsuan Su |
學位類別: |
碩士 Master |
系所名稱: |
工程學院 - 機械工程系 Department of Mechanical Engineering |
論文出版年: | 2018 |
畢業學年度: | 106 |
語文別: | 英文 |
論文頁數: | 95 |
中文關鍵詞: | 微粒影像測速儀 、微粒循跡測速儀 、攝影測量 、三維微型循跡測速儀 |
外文關鍵詞: | Photogrammetric system, 3-D μ-PTV |
相關次數: | 點閱:239 下載:9 |
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本研究嘗試提出一個以攝影測量(photogrammatric)方式分析描述多光譜三維微尺度微粒循跡測速儀之系統光學架構,以便簡化此技術中必須的三維重建過程。根據Maas所提出之研究,簡化的三維投影模型可被用來描述此系統中各不同攝影機位置之光學特徵。系統方程組中的未知係數可使用拍攝聚焦位置的校正影像時影像中所有已知微粒影像之位置進行最小平方法之多變數擬合決定之。利用這些係數則可反算微粒在空間中的真實位置。在此研究中首先以COMSOL軟體建構一個理想的數值計算模型進行驗證。結果顯示相當符合預期結果並顯示有承受小幅誤差之強健性,在單一平面內X,Y與Z軸位置相對誤差達到0.0000141%, 0.0000138%, and 0.0%。實際實驗驗證多平面之結果則顯現出顯著增加的誤差,X,Y與Z軸位置相對誤差達到0.439%, 0.497% 與 54.429%, 尤其以Z軸之誤差較大。 此原因是由於不同Z位置時的系統影像放大倍率改變所導致。未來將需要針對放大倍率隨Z軸位置的改變使用更進一步的系統方程式來減少Z軸方向的位置誤差,以增加系統的實用性。
In this study, a procedure to characterize Multi-Spectral 3D Micro Particle Tracking Velocimetry System is proposed in order to simplify the 3-D reconstruction process. Based on Maas’s study, a simplified optical model is used to describe the camera view of the Multi-Spectral 3D Micro Particle Tracking Velocimetry (3-D μ-PTV) system. The unknown optical parameters can be determined by performing a calibration test and run the least square fit method to the calibration data. Once the coefficients are determined, the real particle coordinates can be determined using a set of photogrammetric equations. This approach is first verified by applying to an ideal numerical model built by COMSOL software. The simulation and experimental results show that 3-D μ-PTV system can be characterized by the photogrammetric system equations with limited success. The in-plane relative mean location error in X, Y and Z-axis are 0.0000141%, 0.0000138%, and 0.0% for the simulation tests of a single z location. In the experimental system, the relative mean location errors are 0.439%, 0.497%, and 54.429% of X, Y and Z-axis, respectively. Significant location errors are found in Z-axis, which is due to the changes of magnification at difference Z-axis position. Extra equations are needed to derive the magnification changing and more work needs to be done to reduce the error of the z position determination.
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