研究生: |
林岳宗 Yue-Zong Lin |
---|---|
論文名稱: |
分子動力學模擬原子鎢/鎳濺鍍在銅基材上之薄膜成長行為 Molecular Dynamics Simulation for Thin Film Growth Behaviors of W/Ni atom Deposition on Cu(001) Substrate |
指導教授: |
林原慶
Yuan-Ching Lin |
口試委員: |
雷添壽
Tian-Shou Lei 鍾俊輝 Chun-Hui Chung 郭俊良 Chun-Liang Kuo |
學位類別: |
碩士 Master |
系所名稱: |
工程學院 - 機械工程系 Department of Mechanical Engineering |
論文出版年: | 2015 |
畢業學年度: | 103 |
語文別: | 中文 |
論文頁數: | 259 |
中文關鍵詞: | 濺鍍 、介面擴散 |
外文關鍵詞: | interdiffuse, sputter deposition |
相關次數: | 點閱:268 下載:1 |
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本論文使用分子動力學模擬(molecular Dynamics, MD)模擬原子鎢/鎳濺鍍在銅基材,探討薄膜的成長機制與成長形貌,並且使用粗糙度及覆蓋率來評估薄膜品質,而模擬的濺鍍製程參數包括基材的溫度、入射原子能量。
模擬結果顯示鎳薄膜與銅基材的結構同為FCC,提高溫度可讓薄膜利用層狀成長以得到低粗糙度和高覆蓋率的良好鍍膜表面,且薄膜與基材在介面互相擴散結合在一起,提高濺鍍能量雖可降低粗糙度以及改善覆蓋率但卻會造成嚴重的交互固溶;鎢濺鍍在銅基材上,因結構不相同又鎢本身內聚力高,所以薄膜是以島嶼狀成長,使得濺鍍製程後期島嶼會開始崩塌並產生架橋效應,因而使薄膜內部產生孔洞缺陷,並且增加基材溫度對此情況的改善有限。提升濺鍍能量則可避免架橋現象產生,以減少薄膜內部缺陷並改善粗糙度,但仍須注意過高的濺鍍能量會讓薄膜或基材汙染,因為此高能量造成薄膜與基材彼此會互相固溶,影響到薄膜品質。
This study applies molecular dynamics (MD) simulation to discuss thin film growth behaviors of W/Ni atom deposition on Cu(001) substrate
with different temperatures and beam energy. Roughness and film coverage to assess the quality of film.
The simulation results show that Ni film crystal structure is the same as Cu substrate (FCC). Layer by layer growth mechanism can obtain low roughness and high coverage rate by increasing the substrate temperature. The film and the substrate interdiffuse together at the interface. Raising the sputtering energy can reduce roughness and improve coverage rate, but will cause serious interaction solution.
Because Tungsten (BCC) is different from Cu (FCC) substrate structure and tungsten have high itself cohesion, the Tungsten film are Volmer Weber growth. At the end of sputtering process, islands will begin to collapse and create bridging effect. Raising the substrate temperatures can’t reduce pores defects well. Raising the sputtering energy can avoid bridging effect, reduce defects, and improve roughness of film surface. But we need to pay attention to the high sputtering energy ,which could result in film or substrate contamination because the high energy resultsin the film and substrate mutual solution and affect film quality.
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