研究生: |
Martin Kostal Martin Kostal |
---|---|
論文名稱: |
Area Allocation for Yield Optimization in Integrated Circuit Area Allocation for Yield Optimization in Integrated Circuit |
指導教授: |
陳伯奇
Poki Chen |
口試委員: |
鍾勇輝
Yung-Hui Chung 陳信樹 Hsin-Shu Chen |
學位類別: |
碩士 Master |
系所名稱: |
電資學院 - 電子工程系 Department of Electronic and Computer Engineering |
論文出版年: | 2018 |
畢業學年度: | 106 |
語文別: | 英文 |
論文頁數: | 45 |
中文關鍵詞: | Optimization 、Random Mismatch 、Systematic Mismatch 、R2R 、Layout |
外文關鍵詞: | Optimization, Random Mismatch, Systematic Mismatch, R2R, Layout |
相關次數: | 點閱:367 下載:8 |
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Recent research in yield enhancement techniques and mitigation of device mismatch is presented. Systematic and random mismatch is studied and identified as the cause of device mismatch. Optimization of IC parameter yield is suggested and conducted with help of a new methodology based on mathematical programming. An algorithm for the optimal area allocation of critical matched devices is shown as well as algorithms for common centroid layout of different sized devices. Newly developed algorithms are presented on R-2R DAC as it is a common IC and comparison to other solutions is given.
Recent research in yield enhancement techniques and mitigation of device mismatch is presented. Systematic and random mismatch is studied and identified as the cause of device mismatch. Optimization of IC parameter yield is suggested and conducted with help of a new methodology based on mathematical programming. An algorithm for the optimal area allocation of critical matched devices is shown as well as algorithms for common centroid layout of different sized devices. Newly developed algorithms are presented on R-2R DAC as it is a common IC and comparison to other solutions is given.
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