新一代平面顯示器AMOLED，主要特色包括自發光、廣視角、快速反應時間、高發光效率與成本低（使用的零組件較少）等優勢。面板在Array段的檢測中，因為有機發光二極體的一般Pixel結構中至少需要兩顆電晶體，其中Switching TFT的檢測模式就只有跟一顆電晶體的TFT-LCD是一樣的，而在Driving TFT的檢測方式，因AMOLED在Array段製程並尚未鍍上OLED，已經超過所能檢測的限制。有鑑於此，本篇論文乃是針對先前技術所遇到的問題，提出多種AMOLED面板陣列(Array)電路中Driving TFT之測試方法，主要是以接觸式檢測機制方式搭配AC Coupling完成整個面板的測試，並結合華昀科技股份有限公司所研發Array Test 之檢測機台實際操作，用以偵測AMOLED面板缺陷之準確度。

Active matrix organic light emitting display (AMOLED) of new generation flat panel display , advantage such as being low of the cost (there are less Component Zone used) that the main characteristic includes emissive , full view angle , fast response , high power efficiency and high brightness . The panel is in the measuring of the Array , because need two of TFT at least in organic light emitting diode of Pixel structure , that the measuring way of Switching TFT only follows TFT of TFT-LCD is the same , measuring way in Driving TFT , because AMOLED prior to the implantation of OLED is already restriction to measured in Array . In view of this , this thesis proposes the method of testing of Driving TFT in circuit of many kinds of AMOLED panel array to the question that technology meets before , mainly match that AC Coupling finishes the whole panel test by way of measuring mechanism of the contact type , and combine a set of practical operation and measuring machine of Array Test that PRIMETECH research and develop , used to detect the accuracy of examining AMOLED panel defect.

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