研究生: |
張祐誠 Yu-cheng Chang |
---|---|
論文名稱: |
應用影像處理於網格狀有機發光二極體有機發光層之瑕疵辨識 Recognition of Organic Emitting Layer Defects of Grid OLED by Image Processing |
指導教授: |
黃昌群
Chang-chiun Huang |
口試委員: |
邱士軒
none 郭中豐 Chung-feng Kuo |
學位類別: |
碩士 Master |
系所名稱: |
工程學院 - 材料科學與工程系 Department of Materials Science and Engineering |
論文出版年: | 2010 |
畢業學年度: | 98 |
語文別: | 中文 |
論文頁數: | 118 |
中文關鍵詞: | 有機發光二極體 、影像處理 、尤拉數 、模糊決策樹 |
外文關鍵詞: | Organic Light Emitting Diode (OLED), Image Process, Euler Number, Fuzzy Decision Tree |
相關次數: | 點閱:158 下載:0 |
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有機發光二極體顯示面板(OLED)為現階段具有自發光性質等多項優點之最新平面顯示元件(Flat Panel Device),各大廠針對各自不同的製造過程所製作出的OLED做檢測,且大多以人工目視的方式檢測。一片OLED多達上千點的發光點,易視覺疲勞而造成誤判,準確性大大降低。本論文針對在發光(Light On)階段有機發光層表面發生單一及同時瑕疵發生之狀況,開發一套自動影像檢測與模糊決策樹分類器系統,瑕疵種類含正常以外,有暗點、斷線及亮度不均,也考量了多種瑕疵同時存在,故增加了另外四種瑕疵情況-暗點與斷線、亮度不均與暗點、亮度不均與斷線及亮度不均與暗點與斷線。影像處理過程中,將影像經過色彩重建,利用九宮格式比較平均亮度值來判定亮度量測;接著針對目標影像輪廓特性,利用幾何學上的尤拉數連通物與洞判斷,標計出大洞數目與小洞數目來判別暗點發生性及線段完整性。瑕疵樣本方面,蒐集210筆瑕疵樣本,由實驗得知,前兩層經由規則式的決策樹分類,辨識率達100%。在暗點發生狀況中利用模糊決策樹,能更準確且合乎人性判斷的分類,辨識率也達100%,此時驗證了瑕疵特徵選取的適用性及分類器合乎人性化的準確性,也明顯的看出此檢測系統成功的被應用於OLED有機發光層的檢測工作上。
Nowadays, the latest flat panel device with autoluminescence and a number of advantages is organic light-emitting diode display panel (OLED). Each individual factory focuses on testing and inspecting OLED produced by different manufacturing processes. There are over thousands of light points on a plate of OLED, causing the mistakes and poor rates of correctness due to worker’s visual fatigue. According to this thesis, in light On phase, the organic light-emitting layer brings about single and multiple defects. We develop an automatic image detection and fuzzy decision tree (FDT) System for three categories of defects-normal, dark dots, broken, and uneven brightness. We also consider the situation that multiple defects exist at the same time and provide another four cases of defects. In image processing, after the reconstruction of colors of images, we can compare the different average values of brightness to decide the brightness through nine palaces of dose algorithm. For the features of contours of target images, by means of the Euler number of connected objects involved in geometry and the determination of holes, we label the number of large hole and small hole respectively to verify the possibility of dark spots as well as line integrity. Otherwise, the experiment results from 210 defect samples, show that recognition rate is 100% by regular classification for the first two phase. While adopting FDT in the state of emergence of dark spots, we find that the method is more accurate and appropriate for human, even the recognition rate is 100%. As a result, we believe the applicability of defect features and the classifier which both are quite accurate, and it is also obvious that this detection system is used in the certain testing way of OLED organic light-emitting layer successfully.
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