研究生: |
林晉安 Chin-An Lin |
---|---|
論文名稱: |
自動治具移除之去嵌入技術探討與治具架構設計 Fixture Structure Design Based on De-embedding Techniques of Automatic Fixtures Removal |
指導教授: |
林丁丙
Ding-Bing Lin |
口試委員: |
林信標
Hsin-Piao Lin 廖文照 Wen-Jiao Liao 曾子芳 Tzu-Fang Tseng 林丁丙 Ding-Bing Lin |
學位類別: |
碩士 Master |
系所名稱: |
電資學院 - 電子工程系 Department of Electronic and Computer Engineering |
論文出版年: | 2022 |
畢業學年度: | 110 |
語文別: | 中文 |
論文頁數: | 52 |
中文關鍵詞: | 測試夾具法 、2xThru 去嵌入技術 、待測物 、One-port x/x+y 去嵌入技術、 |
外文關鍵詞: | Test Fixture Measurement, 2x-Thru De-embedding of Automatic Fixture Removal, One-port x/x+y De-embedding of Automatic Fixture Removal, Time Domain Reflectometry, Device Under Test(DUT) |
相關次數: | 點閱:166 下載:0 |
分享至: |
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
實際量測上,網路分析儀與待測物(Device Under Test)間,會需要治具連
接,為此勢必會產生不屬於原始待測物的特性,需要透過去嵌入技術來消除。
目前在校正與去嵌入有許多方法,比較主流的有:Thru-Reflect-Line 校正技術
(TRL)、2x-Thru De-embedding of Automatic Fixture Removal (AFR)……等。
目前關於量測微帶線(Microstrip)、多層板等待測物,已經有許多論文探討
其治具結構,但直接量測裸線的治具卻很少。本論文將介紹 AFR 去嵌入技術,
後針對該技術提出一種專門量測裸線的治具,利用彈簧針的設計減少量測變異
性,來達到量測重複性與再現性,調整兩側接地過孔的距離防止高階模態的發
生,並透過改變訊號走線的粗細與到地距離,使得整體特徵阻抗連續,避免多
重反射的發生。
In actual condition, the connector (fixture) is required between the network
analyzer and the device under test. For this reason, characteristics that do not belong
to the original device under test will occur, which need to be eliminated through deembedding technology. There are many methods for calibration and de-embedding.
The more mainstream ones are: Thru-Reflect-Line Correction Technology (TRL), 2xThru De-embedding of Automatic Fixture Removal (AFR)...etc.
At present, there have been many papers discussing the fixture structure for
measuring Microstrip and multi-layer boards, but there are few fixtures that measure
iii
cable directly. This paper will introduce the AFR de-embedding technology, and
propose a special fixture for measuring cable directly for this technology. The design
of the pogo pin reduces the variability of measurement to achieve gauge repeatability
and reproducibility; adjust the distance of the grounding hole to prevent the
occurrence of high-order modes, and make the overall characteristic impedance
continuous by changing the thickness of the signal trace and the distance to the
ground to avoid multiple reflections.
[1] Brian C Wadell, "Transmission Line Design Handbook. ", Artech House, pp.79,
1991.
[2] F. Fesharaki, T. Djerafi, M. Chaker and K. Wu, "Guided-Wave Properties of
Mode-Selective Transmission Line, "in IEEE Access, vol. 6, pp. 5379-5392, 2018.
[3] D. M. Pozar, 4th, "Ed. Microwave Engineering, "Chapter 2-4. John Wiley Sons,
2011.
[4] J. Dunsmore, N. Cheng and Y. Zhang, "Characterizations of asymmetric fixtures
with a two-gate approach," 77th ARFTG Microwave Measurement Conference,
2011, pp. 1-6.
[5] D. Deslandes and K. Wu, "Analysis and design of current probe transition from
grounded coplanar to substrate integrated rectangular waveguides," in IEEE
Transactions on Microwave Theory and Techniques, vol. 53, no. 8, pp. 2487-
2494, Aug. 2005.
[6] Y. Chen et al., "Signal-signal D-probe and unified launch pad designs," in IEEE
Electromagnetic Compatibility Magazine, vol. 7, no. 3, pp. 101-106, 3rd Quarter
2018.
42
[7] K. Kim, K. Son, S. Hong, J. Kim and J. Kim, "A Novel Spire Clip-type Pogo
Connector Design with High Electrical and Thermal Reliability," 2021 IEEE
Electrical Design of Advanced Packaging and Systems (EDAPS), 2021, pp. 1-3.