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研究生: 劉旻欣
Min-xin Liu
論文名稱: 精密散射式多感測器三角雷射探頭之研製
Development a precision scattered triangulation laser probe with multi-detectors
指導教授: 修芳仲
Fang-jung Shiou
口試委員: 范光照
Kuang-chao Fan
曾垂拱
Chwei-goong Tseng
學位類別: 碩士
Master
系所名稱: 工程學院 - 機械工程系
Department of Mechanical Engineering
論文出版年: 2007
畢業學年度: 95
語文別: 中文
論文頁數: 130
中文關鍵詞: 散射式三角雷射探頭線電荷耦合元件(Linear CCD)非接觸式量測系統三次元座標量測儀(C.M.M)
外文關鍵詞: Charge coupled device (CCD), Coordinate Measuring Machines (C.M.M)
相關次數: 點閱:221下載:14
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  • 本研究主要為研製一精密散射式多感測器三角雷射探頭。本雷射探頭的開發,在光路設計上以Scheimpflug原理為基礎,將使投射至感測器表面的雷射光點產生恆聚焦且具有光路放大之效果;在構造上以單雷射光源搭配六個線電荷耦合元件(Linear CCD)感測器;在量測方式上提出多種量測模組,其中包含單與雙感測器量測模組和近似環形的五個與六個感測器量測模組,以尋找出雷射探頭的最佳量測方式,且雷射探頭利用雙感測器模組計算其散射光強度,可量得待測物表面之傾斜角度。
    本研究所研製之雷射探頭,其量測範圍為±2 mm,解析度2 μm。本研究以Visual Basic 6.0程式語言開發人機介面來整合三軸微定位平台與自製雷射探頭,以建構一自動化非接觸式三維量測系統。
    在提出的多種量測模組中,針對不同表面粗糙度、斜率、複斜面進行量測比較,根據實驗結果以五個CCD的偏態與峰度濾除法為最佳量測模組,可穩健地得到量測結果與提升量測精度。
    在量測誤差比對方面,以三次元座標量測儀(C.M.M)之量測結果作為比對的基準,根據實驗結果得知階高載具、圓孔載具、標準霧化鋼球、凸高輪廓載具、3D曲面輪廓載具、30°斜面輪廓載具之量測誤差分別為10 μm、14 μm、26 μm、11 μm、64 μm及1.39°,量測系統成功地應用於微細雕刻面、孔洞元件、硬幣外型等三維輪廓量測上。


    The object of the study is to develop a non-contact scattered type triangulation laser probe with multi-detectors. The developed system was configured and assembled based on the Scheimpflug principle. The probe system mainly consists of a micro-focus laser, six collimating lenses, six line charge coupled devices (CCDs), a signal processing circuit, and an A/D interface card. Through the specific arrangement of the six CCDs, four different measurement modules and six methodologies used to obtain the optimal reading for the developed system were possible, namely the standard triangulation probe module, double triangulation probe module, pentagon-shaped triangulation probe module, and an approximately circular triangulation probe module. Three methodologies, namely the averaging method, the median method, and the method using skewness and kurtosis analysis, have been proposed for the pentagon-shaped triangulation probe module. Angle measurement of a inclined surface was possible using the double triangulation probe module.
    The measuring range of the developed laser probe is ±2 mm and the resolution is 2 μm. A set of measuring software programmed with Visual Basic 6.0 language was developed to configure the scanning path, to process the measured data of the laser probe.
    According to the performance test results of four different measurement modules, the pentagon-shaped triangulation probe module using the methodology of skewness and kurtosis analysis to obtain the optimal reading, resulted in the best result. The measurement uncertainty of the developed laser probe system, with respect to different surface roughness and slope, was generally smaller than ±20 microns within the measuring range using the pentagon-shaped triangulation probe module with the methodology of skewness and kurtosis analysis.
    The measurement errors of the development laser probe were analyzed by digitizing four designed test specimens, which were verified by a Coordinate Measuring Machines (C.M.M). Based on the test results, the measurement error of the stepped specimen was about 10 μm, and that of the 2D geometry specimen was about 14 μm, and that of the calibrated matt ball was about 26 μm, and that of the 3D freeform surface was about 64 μm. The developed system was applied successfully to the 3D measurement of some tiny and thin workpieces, such as a small engraved surface, a hollowed workpiece with discontinuity area, and a coin.

    中文摘要 I Abstract III 目 錄 VI 圖索引 X 表索引 XVIII 表索引 XVIII 第一章 緒論 1 1.1研究動機及目的 1 1.2文獻回顧 3 1.2.1雷射探頭之光路與尺寸設計 4 1.2.2以雷射探頭建構之非接觸式量測系統 5 1.2.3雷射探頭之量測精度校驗 6 第二章 雷射探頭之量測光路尺寸設計與理論推導 8 2.1非接觸式三角雷射探頭原理介紹 9 2.2光電感測器的選擇介紹 12 2.2.1電荷耦合元件(CCD)電荷傳輸原理[25] 13 2.2.2電荷耦合元件(CCD)傳輸電荷量計算[25] 14 2.2.3線電荷耦合元件(Linear CCD)性能指標 15 2.2.4線電荷耦合元件(Linear CCD)之可視角 17 2.3雷射探頭之光路與尺寸設計 18 2.3.1雷射探頭設計形式一 19 2.3.2雷射探頭設計形式二 21 2.3.3雷射探頭設計形式三 24 2.4雷射探頭多種量測模組演算法 29 2.5表面傾斜角度運算原理 34 第三章 雷射探頭量測系統元件架構與整合 36 3.1 SURUGA SEIKI三軸微定位平台 36 3.2 Advantech 研華科技A/D卡(PCI-1712) 39 3.3 TOSHIBA TCD1304-DG CCD驅動電路 41 3.4 TCD1304-DG CCD訊號準位調整與放大電路 44 3.5自製非接觸式雷射探頭(含其內部零組件) 46 3.5.1線電荷耦合元件(Linear CCD)規格 46 3.5.2微聚焦雷射光源規格 47 3.5.3聚焦透鏡設計分析與規格 48 3.5.4雷射探頭之主要元件裝配 51 3.6量測掃描路徑規劃方式 52 3.7三軸微定位平台控制與探頭量測之人機介面軟體開發 53 3.8精密散射式多感測器三角雷射探頭量測系統整合 56 第四章 雷射探頭之特性校驗與實例量測 59 4.1 A/D卡之線性校驗 60 4.2線電荷耦合元件(Linear CCD)之特性校驗 61 4.2.1線電荷耦合元件(Linear CCD)之特性校驗一 61 4.2.2線電荷耦合元件(Linear CCD)之特性校驗二 62 4.2.3線電荷耦合元件(Linear CCD)之特性校驗三 64 4.3雷射探頭針對理想散射物體表面進行量測重現性校驗 65 4.4雷射探頭多種量測模組方式之比較 69 4.4.1針對不同表面粗糙度進行量測比較 69 4.4.2針對不同表面斜率進行量測比較 71 4.4.3針對不同複斜面進行量測比較 74 4.4.4多種量測模組方式比較結果 76 4.5雷射探頭針對斜面角度進行斜率量測 77 4.6三軸微定位平台精度校驗 79 4.7雷射探頭固定於主軸之調整裝置設計及校驗結果 82 4.8自製雷射探頭之實例量測與誤差比對 85 4.8.1階高載具量測與誤差比對 86 4.8.2圓孔載具量測與誤差比對 92 4.8.3標準霧化鋼球量測與誤差比對 96 4.8.4 3D曲面輪廓載具量測與誤差比對 102 4.8.5凸高載具量測與誤差比對 107 4.8.6 30°斜面輪廓載具之斜度量測與誤差比對 110 4.9精密非接觸式量測系統之應用實例 113 4.9.1量測應用實例一 : 微細雕刻面 113 4.9.2量測應用實例二 : 孔洞元件 117 4.9.3量測應用實例三 : 硬幣 119 第五章 結論與未來研究方向 121 5.1結論 121 5.2未來研究方向 122 參考文獻 125 作者簡介 130

    1.莊葆華, “非接觸雷射探頭研製”, 機械月刊第二十二卷第二期 ,pp.149-155, 1996.
    2.Wang, L.S., Lee D.L., Nie, M.Y., Zheng, Z.W., “A Study of the Precision Factors of Large-scale Object Surface Profile Laser Scanning Measurement,” Journal of Materials Processing Technology, Vol.129, pp.584-587, 2002.
    3.Tay, C. J., Wang, S.H., Quan C., Shang, H. M., “In Situ Surface Roughness Measurement Using a Laser Scattering Method,” Optics Communications, Vol.218, pp.1-10, 2003.
    4.Ostafiev, V., Sakhno, S., Tymchik, G., Ostafiev, S., “Laser Diffraction Method of Surface Roughness Measurement,” Journal of Materials Processing Technology, pp.817-874, 1997.
    5.Saito, K., Miyoshi, T., “Noncontact 3D Digitizing and Machining System for Free-Form Surfaces,” Annals of the CIRP, Vol.40, pp.483-486, 1991
    6.Lai, X. M., Lin, Z. Q., “Reverse Engineeering Based on Computer Vision for Free-Form Surface,” Chinses Journal of Mechanical Engineeering, Vol.12, No.4, pp.1-8, 1999.
    7.Lee, S. J., Zhuang, B. H., Zhang, W., “Integrated scanning sensor system for 3D free-form surfaces,” The International Society for Optical Engineering, Vol.3024, pp.95-99, 1997.
    8.Shiou, F. J., Cheng, W. Y., “Development of an Innovative Multi-Detector Triangulation Laser Probe,” IEEE, pp.318-322, 2005.
    9.GOH, K. H., “The Applicability of a Laser Triangulation Probe to Non-Contacting Inspection,” INT.J.PROD RES., Vol.24, pp.1331-1348, 1986.
    10.Tay, C. J., Quan, C., “A parametric Study on Surface Roughness Evaluation of Semi-Conductor Wafers by Laser Scattering,” International Journal for Light and Electron Optics, Vol.114, NO.1, pp.1-6, 2003.
    11.Lin, C. S., Lay, Y. L., Chen, P. W., “The Laser Displacement Measurement with Feedback Control in a Magnetic Levitation and Suspension System,” Computer Methods Appl. Mech. Engrg, Vol.190, pp.25-34, 2000.
    12.Fan, K. C., “A Non-contact Measurement of Free-form Surface Profiles,” Computer Integrated Manufacturing Systems, Vol.190, No.4, pp.277-285, 1997.
    13.蔡青憲,“非接觸式雷射探頭系統整合於四軸機台量測系統之研製”,國立台灣科技大學機械工程所碩士論文,2002.
    14.孫孟君,“雷射探頭整合於三軸微定位平台作介觀尺寸工件自動化量測之研究”,國立台灣科技大學機械工程所碩士論文,2006.
    15.陳信宏,“雷射探頭整合於電腦控制四軸機台做小型元件之逆向工程量測”,國立台灣科技大學機械工程所碩士論文,2003.
    16.陳明俊,“接觸式與非接觸式探頭系統整合於CNC工具機上之混合量測研究”,國立台灣科技大學就械工程所碩士論文,2001.
    17.Mikhlyaev, S. V., “Laser Triangulation Systems for sensing Mirror Surface,” Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, Proceeding of SPIE, Vol. 4900, pp.519-524, 2002.
    18.Jinsong, Liu., Luxian, Tian., Lijun, Li., “Light Power Density Distribution of Image Spot of Laser Triangulation Measuring,” Optics and Lasers in Engineering , Vol.29, pp. 457-463, 1998.
    19.蕭興義, “三次元量測儀曲面非接觸式量測法之可行性研究”,國立台灣大學機械工程研究所碩士論文,1989.
    20.林信介, “三次元量床雷射探頭校準之研究”,國立中興大學機械工程系碩士論文,2002.
    21.N.N., Handbook for LB-70(W) Series Instruction Manual, KEYENCE Company (Japan), 1992.
    22.GFM, Lasertriangulation ITS - Intelligente Triangulations Systeme, http://www.gfm-aachen.de
    23.N.N. Integration Handbook for Optoelectronic Distance Measuring System OTM3, Wolf&Beck Sensorik Company, Germany.
    24.Keyence, 感測器影像系統, http://www.keyence.com.tw
    25.米本和也、陳榕庭、彭美桂,CCD/COMS影像感測器之基礎與應用,全華科技圖書股份有限公司,2005.
    26.張健邦,統計學,三民書局股份有限公司,1994.
    27.張素梅,統計學(上),三民書局股份有限公司,1996.
    28.李碩仁、鄭元進, “單點雷射探頭多探測器量測系統研製”, 機械月刊第二十五卷第十二期 ,pp.374~382, 1999.
    29.Kjell, j. G., OPTICAL METROLOGY, WILEY, 2002.
    30.D250 Stepping Motor Controller Operation Manual , Suruga Seiki Co. , 2003.
    31.Toshiba , Linear Image Sensor ,Toshiba Company , 1997.
    32.榎並和雅、杜光宗,數位影像技術入門,建宏出版社,1998.
    33.孫宗瀛、黃金定,常用線性IC資料手冊,全華科技圖書股份有限公司,1999.
    34.耿繼業,何建娃,幾何光學,全華科技圖書股份有限公司,2001.
    35.行政院國家科學委員會精密儀器發展中心,光學鏡片製作與檢測實用技術,2003.
    36.HP 5529A動態校正儀入門指引,惠普公司,1995.
    37.范光照、張郭益,精密量具及機件檢驗,高立圖書, 1998.
    38.Mitutoyo Geopak-Window操作手冊,台灣三豐儀器股份有限公司,2005.
    39.范光照、章明、姚宏宗、許智欽,逆向工程技術及應用,精密量具及機件檢驗,高立圖書, 2000.

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