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研究生: 張元澤
Yuan-Tse Chang
論文名稱: 精密散射式多感測器三角雷射探頭之改良研究
Improvement on the Design of a Precision Scattered Triangulation Laser Probe with Multi-detectors
指導教授: 修芳仲
Fang-Jung Shiou
口試委員: 郭重顯
Chung-Hsien Kuo
鄧昭瑞
Geo-Ry Tang
學位類別: 碩士
Master
系所名稱: 工程學院 - 機械工程系
Department of Mechanical Engineering
論文出版年: 2019
畢業學年度: 107
語文別: 中文
論文頁數: 128
中文關鍵詞: 散射式三角雷射探頭線電荷耦合元件非接觸式量測系統三次元座標量測儀
外文關鍵詞: Scattered type triangulation laser probe, Charge coupled device(CCD), Non-contact precision measurement system, Coordinate Measuring Machines(C.M.M)
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  • 本研究以先期精密散射式多感測器三角雷射探頭研究為架構,開發一改良型多感測器三角雷射探頭。在光路設計方面,本研究以Scheimpflug原理為基礎,使投射至感測器表面之雷射光斑恆聚焦成像;硬體架構同樣以單一雷射光源搭配六個線電荷耦合元件(Linear CCD)感測器並做環型設置;本研究進行光路設計參數改良,使雷射探頭體積減少,增加機上量測之便利性;在驅動Linear CCD方面,改利用微控制器Arduino Mega2560生成所需之訊號,減少驅動成本,同時增加驅動參數改變之便利性。
    本研究開發之雷射探頭其量測範圍為±2 mm,解析度為1.4 μm,軟體搭配LabVIEW程式做量測程式撰寫,同時整合三軸運動平台與雷射探頭,建構一自動化量測系統。在提出的量測模組中,針對不同顏色代木進行量測模組比較,根據實驗結果應用在量測實例工件上,量測模組以五個CCD取平均值法、五個CCD取中值法、六個CCD取平均值法為較佳量測方式。
    在量測誤差比對方面,以三次元座標量測儀(C.M.M.)之量測結果作為比對基準,量測工件有代木材質之階高工件、圓柱面工件、木材之半木圓球,並探討以三個較佳模組量測方式之量測結果。


    This study aims to develop an improved triangulation laser probe based on the previous study of the precision scattering multi-sensor triangular laser probe. The optical path design was based on the Scheimpflug principle, so that the laser spot projected onto the surface of the sensor is constantly focused and imaged. The hardware structure of the developed probe consists of a micro-focus laser, six line CCD sensors with ring-shaped arrangement. The parameters of the optical path has been modified to reduce the volume of the laser probe and to increase the convenience of measurement integration on a CNC machine or other manipulators in the future.
    In terms of driving CCD, the microcontroller Arduino Mega2560 is used to generate the required signals, which reduces the driving cost and increases the convenience of changing the driving parameters.
    In this study, the measurement range of the laser probe is ±2 mm, and the resolution is 1.4 μm. A set of measurement software is developed by the LabVIEW. A three-axis motion platform and the laser probe has been integrated to construct an automated measurement system.
    Different measurement modules have been compared for the specimens with different colors. The proposed measurement modules are the averaging methods calculated by five CCDs, median method determined by five CCDs and the averaging methods by six CCDs.
    The measurement errors of the development laser probe have been verified by a Coordinate Measuring Machines (C.M.M). The measurement test workpieces include the stepped workpiece, the cylindrical surface workpiece, and the wood half-sphere workpiece. According to the performance test results, the three proposed measurement modules have been used for the measurement results.

    目錄 中文摘要 I Abstract II 誌謝 III 目錄 IV 圖索引 VIII 表索引 XIV 第一章 緒論 1 1.1研究動機及目的 1 1.2文獻回顧 4 1.2.1多感測器三角雷射探頭 4 1.2.2以雷射探頭建構之非接觸式量測系統 5 1.2.3雷射探頭之實例應用研究 6 1.2.4 線電荷藕荷元件(Linear CCD)驅動 6 1.3研究方法與論文結構 7 第二章 雷射探頭之光路設計與理論介紹 9 2.1非接觸式三角雷射探頭原理介紹 10 2.2光電感測器的選擇介紹 14 2.2.1線電荷耦合元件(Linear CCD)性能指標 15 2.2.2線電荷耦合元件(Linear CCD)之可視角 17 2.3雷射探頭之光路與尺寸設計 18 2.3.1 Scheimpflug成像原理 18 2.3.2 光路設計及參數說明 19 2-3.3新參數選用 24 2-3.4雷射探頭量測模組演算法 31 第三章 第三章雷射探頭系統元件之架構與整合 34 3.1自製雷射探頭(含內部零組件) 34 3.1.1 Linear CCD規格 35 3.1.2 微聚焦雷射光源 36 3.1.3聚焦透鏡 37 3.2微控制器Arduino Mega2560之Linear CCD驅動 44 3.2.1 TCD1503-DG型Linear CCD輸入訊號介紹 44 3.2.2 微控制器Arduino Mega2560 47 3.2.3驅動Linear CCD之暫存器設定說明 52 3.3.4 ∆Z 量測方法 55 3.3 TOSHIBA TCD1503-DG Linear CCD放大電路 56 3.4 Advantech 研華科技A/D卡(PCIE-1816) 60 3.5三軸運動平台模組 62 3.6 雷射探頭量測系統之人機介面開發 66 3.7雷射探頭系統整合 68 第四章 雷射探頭之特性校驗與實例量測 69 4.1 A/D轉換卡線性校驗 70 4.2 不同顏色代木之系統校驗 71 4.3 雷射探頭系統之實例量測與誤差比對 83 4.3.1階高工件量測與誤差比對 85 4.3.2 圓柱面工件量測與誤差比對 89 4.3.3 半木圓球量測與誤差比對 92 第五章 結論與未來研究方向 98 5.1結論 98 5.2未來研究方向 99 參考文獻 102 附錄一 106 附錄二 110

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