研究生: |
張郁欣 Yu-Shin Chang |
---|---|
論文名稱: |
二硒化鉬層狀半導體之二維電傳輸特性 Two-dimensional Electronic Transport in MoSe2 Layered Semiconductors |
指導教授: |
陳瑞山
Ruei-San Chen |
口試委員: |
李奎毅
Kuei-Yi Lee 傅祖怡 Tsu-Yi Fu 邱博文 Po-Wen Chiu |
學位類別: |
碩士 Master |
系所名稱: |
應用科技學院 - 應用科技研究所 Graduate Institute of Applied Science and Technology |
論文出版年: | 2018 |
畢業學年度: | 106 |
語文別: | 中文 |
論文頁數: | 97 |
中文關鍵詞: | 二硒化鉬 、層狀半導體 、厚度相依電導率 、表面電子聚集 |
外文關鍵詞: | MoSe2, Layered semiconductor, Thickness-dependent conductivity, Surface electron accumulation |
相關次數: | 點閱:312 下載:1 |
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本研究主要探討以化學氣相傳輸法成長的層狀半導體二硒化鉬(MoSe2)之二維電傳輸特性。首先我們分別用拉曼光譜(Raman spectrum)和X光繞射(X-ray diffraction)量測,證實MoSe2晶體具有高品質的單晶特性。以機械剝離法和聚焦離子束技術,將MoSe2製作成具有原始表面(non-fresh surface)和新撕表面(fresh surface)之奈米薄片元件。發現奈米薄片之電導率與塊材相比高出兩個數量級,電導率皆與厚度成反比。由transfer length method (TLM)的模型分析,可定義奈米元件接觸電阻的影響,進一步發現電子傳輸行為並非遵循傳統三維的傳輸行為,而是二維的電傳輸特性。經由掃描穿隧顯微鏡(scanning tunneling microscopy)和角度解析光電子能譜(angle-resolved photoemission spectroscopy)分析晶體表面,證實了原始表面和新撕表面所存在異常高的導電性,是由於表面的電子聚集。另外新撕表面似乎存在結構的不均勻性,導致量測到兩種本質特性,而本質上就有電子聚集的機率較高。利用場效電晶體(field-effect transistor)量測,可發現新撕表面表現出較低的電子遷移率和較高的電子濃度,這可能是因為新撕表面存在較強的表面散射機制。最後透過變溫的FET量測,證實電子遷移率是由雜質散射所主導,進一步證實了表面存在相當高的缺陷與表面態密度。
We report on the two-dimensional (2D) electronic transport in layered semiconductor of molybdenum diselenide (MoSe2) grown by chemical vapor transport. The single-crystalline quality of MoSe2 was examined by the Raman scattering and X-ray diffraction (XRD) measurements. The two-terminal devices of MoSe2 nanosheets with pristine (non-fresh) and fresh surface were fabricated by the mechanical exfoliation and focused-ion beam (FIB) technique. A thickness-dependent electrical conductivity was observed in which the nanosheets exhibit nearly two orders of magnitude higher conductivity than the bulk counterparts. According to the transfer-length method (TLM) analysis, we observed that the MoSe2 nanostructures follow a 2D transport behavior rather than the conventional 3D mode. Presence of surface electron accumulation (SEA), which was confirmed by the scanning tunneling microscopy (STM) and angle-resolved photoemission spectroscopy (ARPES), was found to be physical origin of the 2D electronic transport and relatively high conductive nature in MoSe2. The field-effect transistor (FET) measurement indicates that the nanosheets with the fresh surface exhibit lower mobility and higher electron concentration compared to those with the non-fresh surface. The temperature-dependent FET measurement indicates that the mobility is dominated by impurity scattering, further supports the statement of the presence of the SEA induced by the high-density surface states in MoSe2.
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