研究生: |
余亮 Yu - Liang |
---|---|
論文名稱: |
模糊與TRIZ理論應用在CMP問題與決策系統之研究 The Study of Fuzzy and TRIZ Theory Application to Chemical Mechanical Polishing Problem and Decision System |
指導教授: |
林原慶
Yuan-Ching Lin |
口試委員: |
鐘清枝
T.T.Tsung 黃緒哲 Shiuh-Jer Huang |
學位類別: |
碩士 Master |
系所名稱: |
工程學院 - 機械工程系 Department of Mechanical Engineering |
論文出版年: | 2005 |
畢業學年度: | 93 |
語文別: | 中文 |
論文頁數: | 108 |
中文關鍵詞: | 決策系統 、化學機械研磨 、矛盾衝突矩陣表 、模糊 |
外文關鍵詞: | Decision System, TRIZ, Fuzzy, Chemical Mechanical Polishing |
相關次數: | 點閱:329 下載:0 |
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本文主要研究發展一個CMP問題與決策的知識推論系統,用於八吋矽晶圓拋光、層間絕緣層、IC製程平坦化、金屬層和DRAM的拋光製程。系統採用本體論架構建構出相關的知識領域,再轉換成有用的工程資料庫,此資料庫模式係以物件導向知識表示法來表現配置問題的資料,並運用限制條件建構出不同物件與參數間的關係,接著利用推論法則以及模糊理論,以求得製程問題的最後解決方案,並利用TRIZ理論找出惡化項目解決方法,而且可經由XML檔案傳輸機制傳輸資料,系統不僅可獨立運作,更可連接其它系統或工程代理人。
系統測試結果顯示,針對CMP特定製程問題所推論的最佳化答案與目前解決的方法相當符合。當使用者採用製程參數組合的最佳化答案時,能有效改善製程問題,若配合TRIZ-CMP矛盾衝突矩陣表,即可處理被改善的參數與所對應的相關參數之惡化項目,如此不僅可以徹底解決製程上問題,並且不會因為改變某一製程參數而造成其他製程問題的產生,此外,本系統的問題查詢記錄功能,更可提供CMP製程之創新與研發的正確方向。
This thesis is to study and develop a questions and answers decision system (Q&A system) for chemical and mechanical polishing (CMP) process. The Q&A system proposed in this work can be applied to 8 inch wafer polishing, interlayer dielectric, IC planarization, top metal and DRAM polishing processes. Ontology concept is used to build up the domain knowledge, and then transform the domain knowledge to useful engineering data-based. Additionally, the construction of data-based based on object-oriented knowledge representation. Some constrain conditions are used to link the relationship between the object and process parameter. Some applicable solutions for the specific question of process are proposed by this system according to the inference rules and fuzzy theory. TRIZ theory is used to compromise the conflict between the relative parameters of process. The solutions proposed by this system can be interchange among the relative systems by XML format. Moreover, this Q&A system not only can operate independently but also link other system or engineering agent.
The results of system test show that the solution gotten by this system is reasonable compare with the method which used to solve CMP process. As the user to choose optimal solutions proposed by this system, it could improve the process problems quickly and effectively. Moreover TRIZ-CMP contradiction matrix can avoid another problem occurs during polishing process when some parameters of process were adjusted to solve the specific problem.
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