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    Lifetime and Reliability Improvement for NAND Flash Memory Storage System
    • Department of Computer Science and Information Engineering /109/ Doctor
    • Author: David Kuang-Hui Yu Advisor: Jen-Wei Hsieh
    • As flash memory technology has been scaled down to 1x nm and more bits can be stored in a cell, the…
    • Clicks: 212Downloads: 0
    • Full text public date 2026/09/17 (Intranet public)
    • Full text public date This full text is not authorized to be published. (Internet public)
    • Full text public date This full text is not authorized to be published. (National library)
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