二氧化矽是一種天然生成的化合物，許多礦物、岩石和土壤中都存在著二氧化矽，二氧化矽廣泛用於許多工業應用，包括玻璃、陶瓷、水泥和電子產品的生產，正常情況下，水中的二氧化矽對人體是安全的，因為它無毒，少量攝取並不會對人們的健康構成危害，但若攝入高含量的二氧化矽會增加患腎結石的風險。在工業領域，水中的二氧化矽會對工業有影響，尤其是在用水作為冷卻劑或清潔劑的工業和商業環境中，會在設備和機械上形成水垢和沈積物，會降低設備的效率，二氧化矽沉積會使所有管道流動都會受到摩擦損失的影響，這種能量損失機制取決於流體粘度、管道的形狀和大小以及流速等流動特性，二氧化矽沉積也會造成設備損壞，並導致昂貴的維修或更換費用。在半導體領域，二氧化矽是半導體製造中廣泛使用的材料，水中不必要的二氧化矽會導致在半導體表面形成不需要的二氧化矽層，這會影響它們的電性能並降低它們的品質，這在微電子製造中尤其嚴重，即使是少量的二氧化矽污染也會導致嚴重的缺陷和產量損失。
為了解決上述問題，開發了用於水質檢測的近紅外光光譜儀檢測系統，相較於傳統光譜儀，近紅外光光譜儀檢測系統大大減小了體積及重量。而本論文中以近紅外光光譜儀檢測系統為研究開發的對象，對水中的二氧化矽進行量測。實驗結果顯示自製紅光光檢測光譜儀對矽的量測檢量線 R2 = 0.9926，檢測極限 (Limit of Detection, LOD) = 1.392241 ppb，定量極限 (Limit of Quantification, LOQ) = 4.640805 ppb，實驗證實近紅外光光譜儀檢測系統能夠準確判斷水中二氧化矽元素的濃度，且經過多次測量，實驗值保持穩定。
相較於傳統光譜儀，近紅外光光譜儀檢測系統準確性高、降低成本等等的好處，且採用半導體的製程，可使大小重量大大的降低，使隨身攜帶檢測成為可能，讓檢測場域不會限制於實驗室中，對未來各式應用及量測的研究有明顯的幫助。

Silicon dioxide is a naturally occurring compound found in many minerals, rocks, and
soils. It is widely used in various industrial applications, including the production of glass,ceramics, cement, and electronic products. In the industrial sector, silicon dioxide in water can have an impact, especially in industrial and commercial environments where water is used as a coolant or cleaning agent. It can lead to the formation of scale and deposits on equipment and machinery, reducing their efficiency. In the semiconductor field, silicon dioxide is widely used as a material in semiconductor manufacturing. Unnecessary silicon dioxide in water can lead to the formation of unwanted silicon dioxide layers on the semiconductor surface, affecting their electrical performance and reducing their quality.
To address these issues, a self-made portable water quality testing near-infrared spectroscopy system has been developed. Compared to traditional spectrometers, the near-infrared spectroscopy system significantly reduces the size and weight. This study focuses on the research and development of a near-infrared spectroscopy system for the measurement of silicon dioxide in water. Experimental results show that the self-made red light detection spectrometer has a measurement linearity R2 = 0.9926 Limit of Detection (LOD) = 1.392241 ppb and Limit of Quantification (LOQ) = 4.640805 ppb for silicon.
Compared to traditional spectrometers, the self-made near-infrared spectroscopy system offers benefits such as speed, high accuracy, and cost reduction. It adopts semiconductor processes, significantly reducing its size and weight, making portable detection possible. This allows testing to be conducted outside the confines of a laboratory, providing significant assistance in various future applications and research in measurements.

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