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研究生: 嚴吉緯
Ji-wei Yan
論文名稱: 雙PLL核心之高精度數位至時間轉換器
High Accuracy Digital-to-Time Converter with Dual PLLs
指導教授: 陳伯奇
Poki Chen
口試委員: 陳科宏
Ke-horng Chen
宋國明
Guo-ming Sung
楊湰頡
Rong-jyi Yang
學位類別: 碩士
Master
系所名稱: 電資學院 - 電子工程系
Department of Electronic and Computer Engineering
論文出版年: 2008
畢業學年度: 96
語文別: 中文
論文頁數: 131
中文關鍵詞: 數位至時間轉換器時脈產生器游標卡尺法鎖相迴路
外文關鍵詞: Digital-to-time Converter, time generator, veriner, phase-locked loop
相關次數: 點閱:320下載:4
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  • 隨著積體電路系統的發展,對各種高解析度之轉換器需求也急速的增加,因此高精度數位至時間轉換器的地位也日漸重要,其最主要應用在許多自動測試儀器及晶片上,迄今已發展出各種不同的架構及電路形式,適用於各項測試機台儀器中。其中,游標卡尺法在追求高解析度上為眾多方法中之翹楚,由於一般數位至時間轉換器利用游標卡尺法來實現之目的係利用兩相近之參考頻率來達成高解析度目標,然而其量測範圍往往無法超過一個參考週期;本研究提出增加量測範圍之電路以解決量測範圍受限之缺點,並提高整體最佳解析度達到8.3ps,最寬脈波產生寬度達到1s以上;此外,為有效降低環境變異(PVT)之影響,利用兩組鎖相迴路(Phase-Locked Loop)來自動校準該二參考頻率之振盪週期以達成解析度不受影響之目的。本晶片以TSMC 0.35-um CMOS 2P4M標準製程,輸入操作頻率為1.83MHz,在輸入3.3伏特的工作電壓下,總功率消耗為80毫瓦,全部晶片面積為2.01mm2。


    A high accuracy Digital-to-Time Converter (DTC) is proposed in the thesis to fit the dramatically increased demand of nowadays VLSI test chips or advance test systems. Many kinds of DTC have been developed by researchers. Among those, the vernier DTC is the best one in some aspects. Originally, the vernier principle is applied to high resolution DTC by using two reference clock with very close frequencies to make the effective resolution equal to the period difference of the reference clocks. However, the operation range is usually limited to one reference period. The operation range limitation is successfully eliminated in the proposed DTC, and two phase-locked loops are utilized to alleviate the PVT sensitivity to achieve a resolution as fine as 9 ps. The realized operation range is 1s which can be extended to infinity theoretically.
    This proposed chip have been implemented in a TSMC 0.35um 2P4M standard CMOS process. The reference clock frequency is designed to be 1.83 MHz, and the power consumption is 80mW under 3.3v single powersupply. The total chip size is 2.01mm2.

    第一章 緒論 1 1-1 研究動機 1 1-2 論文架構 3 第二章 數位至時間轉換器 4 2-1 數位至時間轉換器簡介 4 2-2 架構說明 6 2-2.1 絕對時間延遲之數位至時間轉換器 6 2-2.2 相對時間延遲之數位至時間轉換器 9 2-3 本論文架構 13 2-3.1 游標卡尺法之數位至時間轉換器 13 第三章 鎖相迴路原理及設計 18 3-1 各種鎖相迴路型態介紹 19 3-1.1 線性鎖相迴路 (Linear PLL,LPLL) 19 3-1.2 半數位鎖相迴路 (Half-Digital PLL,HDPLL) 20 3-1.3 全數位鎖相迴路 (All-Digital PLL,ADPLL) 22 3-2 鎖相迴路之應用 23 3-2.1 鎖相迴路的倍頻功能 23 3-2.2 減少不對稱的時脈週期 25 3-2.3 減少雜訊和資料的再重建 26 3-3 鎖相迴路各區塊電路說明與討論 28 3-3.1 相位頻率偵測器(Phase / Frequency detector) 28 3-3.2 充電泵(Charge Pump) 34 3-3.3 電壓控制振盪器(Voltage Control Oscillator) 42 3-3.4 除頻器(Frequency Divider) 53 3-3.5 迴路濾波器(Loop Filter)與穩定度分析 58 3-3.5.1 二階鎖相迴路(Second-order PLL) 60 3-3.5.2 三階鎖相迴路(Thrid-order PLL) 62 3-3.5.3 雜訊響應(Noise Response) 67 第四章 鎖相迴路模擬與驗證 71 4-1 設計流程與考量 71 4-2 相位頻率偵測器電路設計與模擬 73 4-3 充電泵電路設計與模擬 75 4-4 壓控震盪器電路設計與模擬 78 4-5 除頻器電路與模擬 84 4-6 迴路濾波器 86 4-7 鎖相迴路整體功能模擬 87 第五章 數位至時間轉換器設計與模擬 94 5-1 加載型下數計數器電路與模擬 94 5-2 數位至時間轉換器電路模擬 99 第六章 實驗結果與未來展望 106 6-1 晶片佈局 106 6-2 量測環境 109 6-3 量測結果 113 6-4 結論與未來展望 115 6-4.1 結論 115 6-4.2 未來展望 115 參 考 文 獻 116

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