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研究生: 安德罗
Andromeda Dwi Laksono
論文名稱: Interfacial Reactions between Pb-free Solders and Cu-Ti Alloy (C1990HP)
Interfacial Reactions between Pb-free Solders and Cu-Ti Alloy (C1990HP)
指導教授: 顏怡文
Yee-wen Yen
口試委員: 周賢鎧
Shyan-Kay Jou
陳志銘
Chih-Ming Chen
學位類別: 碩士
Master
系所名稱: 工程學院 - 材料科學與工程系
Department of Materials Science and Engineering
論文出版年: 2018
畢業學年度: 106
語文別: 英文
論文頁數: 110
中文關鍵詞: interfacial reactionC1990HPlead-free solderstensile strength
外文關鍵詞: interfacial reaction, C1990HP, lead-free solders, tensile strength
相關次數: 點閱:255下載:0
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The interfacial reaction between lead-free solders (Sn, Sn-3.0Ag-0.5Cu (SAC305), and Sn-9Zn (SZ)) and substrate Cu-4.3 at% Ti (C1990HP) was investigated using the reaction couple technique at 240, 255, and 270 oC. The results show that the Cu6Sn5 and small precipitated Ti2Sn3 phase formed at the Sn/C1990HP and SAC305/C1990HP interface. Meanwhile, the driving force clearly seen for Cu6Sn5 in the SAC305 solder to spall massively from the interface originates from prolonged the reaction time. The content of Ti substantially increased the amount of IMC at the interface which separated parts of Cu6Sn5 compounds with the inner region containing more Ti than the outer for Sn/C1990HP and SAC305/C1990HP system. The existence of Sn/C1990HP and SAC305/C1990HP on the liquid/solid state reaction indicates that spalling occurred with changes in reaction time and temperature. With increased reaction temperature and time, the grain produced an abnormal condition resulting in Cu6Sn5 not accumulating at the interface and spalling into the solder in addition to grain ripening and an increase in total layer thickness. The hexagonal prism-shaped Cu6Sn5 phase is found on the top of the C1990HP substrate when the Cu6Sn5 layer detaches for Sn/C1990HP and SAC305/C1990HP system. However, a continuous and laminar IMC layer was occurred in SZ/C1990HP reaction couple. The new IMC grains grew and gradually merged together to compose a continuous IMC layer. The planar CuZn5 and Cu5Zn8 layer formed in almost reaction. An IMC Cu5Zn8 serves as a diffusion barrier in the SZ/C1990HP system. However, the CuZn5 phase is disappeared when increased time and temperature. For Sn/C1990HP, SAC305/C1990HP, and SZ/C1990HP systems, the thickness of the IMCs layer increases when the reaction time and temperature increase.
Further investigation, the mechanical test of joint strength in Sn/C1990HP revealed in this study. The fracture mode for 240, 255, and 270 oC are ductile, brittle & ductile, and brittle, respectively. The tensile strength enhances with increasing reflow temperature. However, it weakens with increasing aging time.


The interfacial reaction between lead-free solders (Sn, Sn-3.0Ag-0.5Cu (SAC305), and Sn-9Zn (SZ)) and substrate Cu-4.3 at% Ti (C1990HP) was investigated using the reaction couple technique at 240, 255, and 270 oC. The results show that the Cu6Sn5 and small precipitated Ti2Sn3 phase formed at the Sn/C1990HP and SAC305/C1990HP interface. Meanwhile, the driving force clearly seen for Cu6Sn5 in the SAC305 solder to spall massively from the interface originates from prolonged the reaction time. The content of Ti substantially increased the amount of IMC at the interface which separated parts of Cu6Sn5 compounds with the inner region containing more Ti than the outer for Sn/C1990HP and SAC305/C1990HP system. The existence of Sn/C1990HP and SAC305/C1990HP on the liquid/solid state reaction indicates that spalling occurred with changes in reaction time and temperature. With increased reaction temperature and time, the grain produced an abnormal condition resulting in Cu6Sn5 not accumulating at the interface and spalling into the solder in addition to grain ripening and an increase in total layer thickness. The hexagonal prism-shaped Cu6Sn5 phase is found on the top of the C1990HP substrate when the Cu6Sn5 layer detaches for Sn/C1990HP and SAC305/C1990HP system. However, a continuous and laminar IMC layer was occurred in SZ/C1990HP reaction couple. The new IMC grains grew and gradually merged together to compose a continuous IMC layer. The planar CuZn5 and Cu5Zn8 layer formed in almost reaction. An IMC Cu5Zn8 serves as a diffusion barrier in the SZ/C1990HP system. However, the CuZn5 phase is disappeared when increased time and temperature. For Sn/C1990HP, SAC305/C1990HP, and SZ/C1990HP systems, the thickness of the IMCs layer increases when the reaction time and temperature increase.
Further investigation, the mechanical test of joint strength in Sn/C1990HP revealed in this study. The fracture mode for 240, 255, and 270 oC are ductile, brittle & ductile, and brittle, respectively. The tensile strength enhances with increasing reflow temperature. However, it weakens with increasing aging time.

Contents Abstract i List of Figure v List of Table ix Chapter 1 Introduction 1 Chapter 2 Literature Review 5 2.1 Solder Joint Technology 5 2.1.1 Lead-free Solder Joint 5 2.1.2 Surface Mount Technology 6 2.1.3 Flip Chip Technology 8 2.1.4 Interfacial Reactions 9 2.1.5 Wetting Reaction 11 2.1.6 IMC Formation in Wetting Reactions 12 2.2 Diffusion Theory 14 2.2.1 Steady-State Diffusion 14 2.2.2 Nonsteady-State Diffusion 15 2.3 Alloying Elements on the Reactions between Cu and Sn 16 2.3.1 Effect of Elements on the Cu-based Substrate 16 2.3.2 Effect of Elements on the Sn-based Solder 18 2.4 Phase Diagrams 21 Chapter 3 Experimental Procedures 22 3.1 Preparation of C1990HP Substrates 22 3.2 Preparation of Lead-free Solders 22 3.3 Preparation of Lead-free Solder/C1990HP Reaction Couples 23 3.4 Metallographic Procedure 23 3.5 Interface Observation and Analysis 24 3.6 Preparation of Tensile Test 25 Chapter 4 Results and Discussion 27 4.1 Sn/C1990HP Interfacial Reactions 27 4.1.1 Sn/C1990HP Interfacial Reaction at 240 oC 27 4.1.2 Sn/C1990HP Interfacial Reaction at 255 oC 29 4.1.3 Sn/C1990HP Interfacial Reaction at 270 oC 31 4.1.4 Deep Etched for Sn/C1990HP Joint 33 4.1.5 The Reaction Mechanism of Sn/C1990HP Reaction Couples 33 4.2 SAC305/C1990HP Interfacial Reactions 38 4.2.1 SAC305/C1990HP Interfacial Reaction at 240 oC 40 4.2.2 SAC305/C1990HP Interfacial Reaction at 255 oC 41 4.2.3 SAC305/C1990HP Interfacial Reaction at 270 oC 43 4.2.4 Deep Etched for SAC305/C1990HP Joint 45 4.2.5 The Reaction Mechanism of SAC305/C1990HP Reaction Couples 46 4.3 SZ/C1990HP Interfacial Reactions 49 4.3.1 SZ/C1990HP Interfacial Reaction at 240 oC 50 4.3.2 SZ/C1990HP Interfacial Reaction at 255 oC 51 4.3.3 SZ/C1990HP Interfacial Reaction at 270 oC 53 4.3.4 Deep Etched for SZ/C1990HP Joint 55 4.3.5 The Reaction Mechanism of SZ/C1990HP Reaction Couples 56 4.4 Reaction Kinetics 58 4.5 Tensile Properties of Sn/C1990HP Joining 63 4.5.1 Fracture Surface Analysis at 240 oC Reflowed 64 4.5.2 Fracture Surface Analysis at 255 oC Reflowed 65 4.5.3 Fracture Surface Analysis at 270 oC Reflowed 66 4.5.4 Mapping in the Fracture Surfaces 68 Chapter 5 Conclusion 71 Reference 72 Appendix …………………………………………………………………………….77

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