研究生: |
馬佩琪 PEI-CHI MA |
---|---|
論文名稱: |
以射極-濺鍍沉積氧化銦鎢及氫化氧化銦之研究 The Study of Tungsten Doped Indium Oxide and Hydrogen Doped Indium Oxide Fabrication by RF-sputter method |
指導教授: |
洪儒生
Lu-Sheng Hong |
口試委員: |
葉秉慧
Pinghui Sophia Yeh 陳良益 Liang-Yih Chen |
學位類別: |
碩士 Master |
系所名稱: |
工程學院 - 化學工程系 Department of Chemical Engineering |
論文出版年: | 2015 |
畢業學年度: | 103 |
語文別: | 中文 |
論文頁數: | 79 |
中文關鍵詞: | 參鎢氧化銦 、氫化氧化銦 、射極-濺鍍 、透明導電膜 |
外文關鍵詞: | tungsten-doped indium oxide, hydrogen-doped indium oxide, RF-sputtering, electrical resistivity |
相關次數: | 點閱:205 下載:2 |
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在本論文中我們使用射極-濺鍍沉積參鎢氧化銦以及氫化氧化銦之透明導電膜,期望能利用該等材質較高的功函數以及光學透過特性應用於矽晶異質接面太陽能電池的製作上,以獲得較佳電池轉換效率之表現。實驗結果顯示,當調整電極間距為3.5 cm、反應壓力5mtorr、電漿功率密度1W/cm2、基材溫度25°C的製程參數下沉積出的參鎢氧化銦薄膜具有低至4.5×10-4Ω∙cm的電阻率以及在800-1800奈米長波長波段高達75%以上的透光率(沉積厚度約220nm)。相對的,調整電極間距5cm、反應壓力5mtorr、電漿功率密度0.75W/cm2、基材溫度25°C並以水蒸氣為氫源的製程參數所沉積出的氫化氧化銦薄膜呈現最低僅有3.5×10-3Ω∙cm的電阻率,但是在長波長800-1800奈米區域呈現高達92%的光學穿透率(沉積厚度約250nm)。
We have fabricated tungsten-doped indium oxide (IWO) and hydrogen-doped indium oxide (IO:H) thin layers using RF-sputtering technique. By using a one atomic weight percent of tungsten IWO target, the lowest resistivity of the IWO layers fabricated showed 4.5×10-4 Ω∙cm at a film thickness of 220 nm. This film also showed an averaged transmittance of 75% in the IR range of 800-1800 nm. By contrast, hydrogen doped indium oxide (IO:H) layers, prepared using H2O as the source of hydrogen, showed a very high light transmittance of 92% in the wavelength range of 800-1800 nm, yet a relatively high electrical resistivity of 3.5×10-3 Ω∙cm at a film thickness of 250 nm.
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