本研究使用穿透式電子顯微鏡與掃描穿透式電子顯微鏡技術，分析薄膜高熵氧化物異質介面系統分析。
一種基於尖晶石結構的高熵氧化物，成長在兩種不同的氧化物基板上，並使用聚焦離子束製備試片。在高解析穿透式電子顯微鏡中，我們驗證high-entropy oxide (HEO) /MgO與high-entropy oxide (HEO) /MgAl2O4的介面型態皆為不連貫介面。
我們發現經由FIB所製備的樣品，即便存在些許的汙染物與厚度梯度的問題，還是可以進行掃描穿透式電子顯微鏡與電子損失能譜儀結合Smart Align軟體的原子能譜分析，並在此研究中達到原子級解析，使我們以直觀的方式理解此材料的晶體結構、化學組成分佈、四面體與八面體格隙分佈、介面交互擴散以及半定量電子結構。

In this study, we utilized transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) techniques to characterize thin film high-entropy oxides (HEO) heterostructure interfaces. The high-entropy oxides based on a spinel structure was grown on two different oxide substrates and we used a focused ion beam (FIB) prepared sample. In high-resolution TEM, we confirmed that the interfacial coherence of HEO/MgO and HEO/MgAl2O4 was an incoherent interface. We found that even with some contaminations and thickness gradients, FIB-prepared samples can be characterized using scanning transmission electron microscopy and electron-energy loss spectroscopy combined with the Smart Align software, achieving an atomic resolution in this study. This allowed us to understand the crystal structures, chemical composition distributions, tetrahedral and octahedral site distributions, interface inter-diffusion, and semi-quantitative electronic structures of the material in an intuitive way.

1 Jung Wen Yeh, S.‐K. Chen, S.‐J. Lin, J.‐Y. Gan, T. S. Chin, Tao-Tsung Shun, C. H. Tsau, and Sung Yun Chang, Advanced Engineering Materials 6 (2004).
2 Christina M. Rost, Edward Sachet, Trent Borman, Ali Moballegh, Elizabeth C. Dickey, Dong Hou, Jacob L. Jones, Stefano Curtarolo, and Jon-Paul Maria, Nature Communications 6 (1), 8485 (2015).
3 Takamitsu Yamanaka and Yoshio Takéuchi, Zeitschrift Fur Kristallographie 165, 65 (1983).
4 Juliusz Dąbrowa, Mirosław Stygar, Andrzej Mikuła, Arkadiusz Knapik, Krzysztof Mroczka, Waldemar Tejchman, Marek Danielewski, and Manfred Martin, Materials Letters 216, 32 (2018).
5 E. J. W. Verwey, Nature 144 (3642), 327 (1939).
6 Jisoo Lee, Soon Gu Kwon, Je-Geun Park, and Taeghwan Hyeon, Nano Letters 15 (7), 4337 (2015).
7 H. A. Jahn, E. Teller, and Frederick George Donnan, Proceedings of the Royal Society of London. Series A - Mathematical and Physical Sciences 161 (905), 220 (1937).
8 R. D. Shannon, Acta Crystallographica Section A 32 (5), 751 (1976).
9 Easterling, Kenneth E. Porter, David A. Sherif, and Mohamed, Phase Transformations in Metals and Alloys, Third Edition. (CRC Press, 2009).
10 K. Reichelt, Vacuum 38 (12), 1083 (1988).
11 Joy Mittra, Geogy Jiju Abraham, Manoj Kesaria, Sumit Bahl, Aman Gupta, Sonnada M. Shivaprasad, Chebolu Subrahmanya Viswanadham, Ulhas Digambar Kulkarni, and Gautam Kumar Dey, Materials Science Forum 710, 757 (2012).
12 Department of Materials Science and Engineering. National Taiwan University., (2012).
13 Yuren Wen, Tongtong Shang, and Lin Gu, Microscopy 66 (1), 25 (2016).
14 GATAN Company (https://www.gatan.com/).
15 Lewys Jones, Aakash Varambhia, Richard Beanland, Demie Kepaptsoglou, Ian Griffiths, Akimitsu Ishizuka, Feridoon Azough, Robert Freer, Kazuo Ishizuka, David Cherns, Quentin M Ramasse, Sergio Lozano-Perez, and Peter D Nellist, Microscopy 67 (suppl_1), i98 (2018).