研究生: |
翁瑄博 Xuan-Bo Wong |
---|---|
論文名稱: |
奈微米鑽石於不同結構矽基板之場發射特性研究 Nano/Micro crystalline diamond on silicon-based templates for field emission studies |
指導教授: |
黃柏仁
Bohr-Ran Huang |
口試委員: |
周賢鎧
Shyankay Jou 張守進 none |
學位類別: |
碩士 Master |
系所名稱: |
電資學院 - 光電工程研究所 Graduate Institute of Electro-Optical Engineering |
論文出版年: | 2013 |
畢業學年度: | 101 |
語文別: | 中文 |
論文頁數: | 81 |
中文關鍵詞: | 矽奈米線 、金字塔 、奈米鑽石 |
外文關鍵詞: | NCD, SiNWs, Pyramid |
相關次數: | 點閱:342 下載:5 |
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本論文主要是探討在不同結構上成長奈微米鑽石之場發射特性之影響。本研究中係使用微波電漿化學氣相沉積系統將奈微米鑽石沉積於平面矽、金字塔及矽奈米線/金字塔結構,藉由場發射電子顯微鏡觀察鑽石的表面形態,並分別利用拉曼光譜儀與化學分析電子光譜儀及原子力顯微鏡分析鑽石品質特徵與sp3/sp2 比值及鑽石表面粗糙度。
經由超音波震盪前處理NCD/SiNWs/Pyramid-Si的結構比其他結構有較低的起始電場(3.11 V/μm),如NCD/Planar-Si (4.8 V/μm)及NCD/Pyramid-Si (4.35 V/μm)。而使用研磨加震盪前處理的NCD/SiNWs/Pyramid-Si結構有較低的起始電場(3.2 V/μm),而NCD/Pyramid-Si之起始電場為(3.9 V/μm)。
在使用C10H16與乙二醇做為種子層在平面及金字塔結構上成長微米鑽石,其起始電場由MCD/Planar-Si 3.86 V/μm降低至MCD/Pyramid-Si 3.15 V/μm,使用C10H16與二乙二醇做為種子層在平面及金字塔結構上成長微米鑽石,其起始電場則由MCD/Planar-Si 4.5 V/μm降低至MCD/Pyramid-Si 2.9 V/μm。
In this dissertation, Nano/Micro crystalline diamond were fabricated on different silicon-based structures to study the effect on the field emission properties. NCD and MCD were deposited on Planar-Si, Pyramid-Si and SiNWs/Pyramid-Si by microwave plasma chemical vapor deposition system. The surface morphologies of diamond were characterized by the field emission scanning electron microscopy. The characterizations of diamond were analyzed by Raman, XPS and AFM to show the quality, the sp3/sp2 ratio and average roughness of diamond, respectively.
It is found that the turn on electric field of NCD/SiNWs/Pyramid-Si field emission cathode is lower (3.11 V/μm) through ultrasonication pretreatment than other structures such as NCD/Planar-Si (4.8 V/μm) and NCD/Pyramid-Si (4.35 V/μm). And the lower turn on electric field NCD/SiNWs/Pyramid-Si (3.2 V/μm) through rub and ultrasonication pretreatments than other structure such as NCD/Pyramid-Si (3.9 V/μm).
While using C10H16 and ethylene glycol as seeds layer to deposite MCD on Planar-Si and Pyramid structures, the turn on field improved from 3.86 V/μm of MCD/Planar-Si to 3.15 V/μm of MCD/Pyramid-Si. And 4.5 V/μm of MCD/Planar-Si to 2.9 V/μm of MCD/Pyramid-Si by using C10H16 and diethylene glycol as seeds layer.
Keyword: NCD, SiNWs, Pyramid
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