高光譜成像技術具備分析物質的能力，廣泛應用於農業、食品加工、礦物學、環境監測、藝術、深空探測等諸多領域。儀器的微型化與低成本已成為高光譜譜成像儀的一個重要發展方向，線性漸變濾光片光譜成像技術與傳統光柵分光技術相比，具有系統緊湊、結構簡單的優點，獲得了國內外研究機構的重視。
本研究使用之薄膜厚度理論透過建立蒸鍍機台數學模型，於製程上加入蒸鍍機台相關參數、擋板高度設計等，並利用數值模擬軟體找出基板上之膜厚分佈及輪廓，判斷膜厚分佈中，相對厚度25%至75%為最佳線性度，利用此結果，找出不同擋板高度下，所求得線性漸變區寬度，應用於線性漸變濾波片穿透率光譜之表現。
本實驗應用於可見至近紅外波段400 – 1000 nm進行膜堆設計，使用於業界廣泛使用的光學鍍膜設計軟體TF-Calc，分別以TiO2與SiO2作為高低折射率材料，使用對稱式的膜堆設計並優化，接著分析膜堆在線性漸變膜厚下的光譜表現，擬合穿透波長與其對應的薄膜厚度，確保線性度的可能性。
於光譜儀成像系統上，本文提出光學模擬方法，根據膜堆漸變區寬度與波段選用合適偵測器，建立偵測器座標系統並確立理想光譜響應後，進一步分析不同的焦比與濾波片組裝誤差對實際光譜響應的影響，於系統實際組裝時可考慮到不同系統光譜分辨率的要求，選擇合適系統參數。

Hyperspectral imaging technology has the ability to analyze substances,used in agriculture, food processing, mineralogy, environmental monitoring, art, deep space exploration and many other fields. The miniaturization and low cost of the instrument have become an important development direction of the hyperspectral spectrum imager. Linear variable filter spectral imaging technology has the advantages of compact system and simple structure compared with the traditional grating spectroscopic technology. Received the attention of domestic and foreign research institutions.
The film thickness theory used in this research is to establish the mathematical model of the evaporation machine, add the relevant parameters of the evaporation machine and the height design of the baffle to the process, and use the numerical simulation software to find the film thickness distribution and contour on the substrate and judge In the film thickness distribution, the relative thickness of 25% to 75% is the best linearity. Using this result, find the width of the linear gradient area at different mask heights, and apply it to the performance of the linear variable filter transmittance spectrum.
This experiment is applied to the design of the film stack in the visible-to-Near Infared 400 – 1000 nm. It is used in the industry's widely used optical coating design software TF-Calc. TiO2 and SiO2 are used as high and low refractive index materials, respectively. Then, analyze the spectral performance of the film stack under the linear gradient film thickness, fit the penetration wavelength and the corresponding film thickness, and ensure the possibility of linearity.
On the spectrometer imaging system, this paper proposes an optical simulation method, selects a suitable detector according to the width and band of the linear area of the film stack, establishes the detector coordinate system and simulate the ideal spectral response, Analyze the effect of different optical parameters and system assembly errors on the actual spectral response. The influence of the actual spectral response can be taken into account when the system is actually assembled, and the appropriate system parameters can be selected.

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