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研究生: 簡國恩
Kuo-En Chien
論文名稱: 提高電流均勻性之三維主動式有機發光二極體畫素電路
Novel Pixel Circuit Designed to Improve the Uniformity of OLED Driving Current for 3D AMOLED Display
指導教授: 范慶麟
CHING-LIN FAN
口試委員: 李志堅
CHIH-CHIEN LI
蔡永誠
YUNG-CHENG TSAI
顏文正
WEN-CHENG YEN
學位類別: 碩士
Master
系所名稱: 電資學院 - 電子工程系
Department of Electronic and Computer Engineering
論文出版年: 2016
畢業學年度: 104
語文別: 英文
論文頁數: 82
中文關鍵詞: 有機發光二極體 畫素電路
外文關鍵詞: AMOLED pixel circuit
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  • 主動式有機發光二極體(AMOLED)被視為次世代的顯示技術,其優點有輕薄、低功耗、反應時間快、高對比、可視角大、透明且具有可撓性,而畫素電路由薄膜電晶體(TFT)和電容組成,其中薄膜電晶體用來驅動有機發光二極體(OLED)並且當作開關控制電流,電容則用來儲存電壓訊號,然而有機發光二極體因為製程上的因素和經過長時間操作下其電特性會偏移,造成電流分布不均勻進而降低顯示器品質。近年來三維顯示技術(3D)以逐漸成熟且以商品化,三維顯示技術在未來必成為主流,為了達成立體效果,畫面更新頻率需要為二維顯示的二倍以上,此外有二種方式分別可以應用在三維顯示,一是同步發光(SE)模式再者是依序發光(PE)模式,同步發光模式具有較好的對比度與效率,根據上述問題此論文提出三個新穎的畫素電路,全部的畫素電路皆使用同步發光模式並可應用於三維顯示器,實驗都經過積體電路模擬程式(SPICE)驗證以確保畫素電路的操作無誤。
    第一個畫素電路是由低溫多晶矽(LTPS)組成,其架構包含了四顆薄膜電晶體和二顆電容,此電路的特點是可以透過逆偏壓延長有機發光二極體的壽命同時提供額外電流當有機發光二極體的特性衰退時,模擬結果顯示在薄膜電晶體的臨界電壓飄移正負0.5 V時,此電路的電流誤差率只有1.06%。第二個畫素電路是由氧化銦鎵鋅(IGZO)製作的薄膜電晶體組成,其架構同樣是四顆薄膜電晶體和二顆電容,由於氧化銦鎵鋅的材料結構均勻非常適合應用在大型的面板上,根據模擬結果,當有機發光二極體特性衰退時,補償電路可提供額外的電流,進而維持面板亮度,且在臨界電壓飄移正負2 V時此電路的電流錯誤率僅有1.1%,再經由模擬三十吋的面板得到的結果,得到我們的輸出電流在大面板上有很好的均勻性。最後一個補償電路由二顆低溫多晶矽薄膜電晶體和二顆電容組成的,此補償電路的架構十分精簡,因此電路擁有很高的良率、開口率加上具有逆偏壓改善有機發光二極體壽命的功能,使得臨界電壓飄移正負0.33 V時其電流錯誤率為2.4%。以上提出的畫素電路皆經由模擬軟體驗證和與多篇期刊做比較,來確保提出的畫素電路具有良好的補償功能。


    Active matrix organic light emitting diode (AMOLED) display is considered to be the next generation of display technology. It has several advantages such as thin structure, low power consumption, fast response time, better contrast, better view angle, great transparency and flexibility. As for AMOLED display, each pixel in AMOLED display needs a pixel circuit to act as power driving device. The pixel circuit is composed of thin film transistors (TFTs) and capacitors, where TFTs play the role of pixel switch of AMOLED display and capacitors play the role of storing the data voltage. However, the electrical characteristic of TFT will degrade because of the fabrication process and long time operation. In addition, large size AMOLED display suffers from the problem of voltage drop and OLED luminance decay, which will affect the image quality of the display. Recently, three dimensional (3D) technology becomes more popular and is claimed to be the future prospect. 3D image can be achieved through high frame rate and two emission methods. The two emission methods are the simultaneous emission (SE) method and the progressive emission (PE) method. From the perspectives of contrast and efficiency, SE method has better performance than PE method. In order to solve the degradation issues, this thesis presents three compensating pixel circuits which were all verified by AIM-SPICE and operated under SE method with 240 Hz frame rate. Besides, all three compensating pixel circuits were designed for full high definition (FHD) 3D display.
    The first pixel circuit is composed of 4 TFTs and 2 Capacitors. The TFTs which we used in the pixel circuit is low temperature polysilicon (LTPS) TFTs. Due to its high mobility and stability, the circuit has high threshold voltage shift immunity and can provide extra current to balance the luminance. It can also alleviate OLED degradation by its reverse bias. From the simulation results, the average current error rate is 1.06% (∆V_TH±0.5 V). For the second circuit, a 4T2C pixel circuit with amorphous Indium gallium zinc oxide (a-IGZO) TFTs was proposed. Pixel circuit with a-IGZO TFTs is suit for large size display owing to its great uniformity. Experimental results have shown that the second pixel circuit can provide small amount of current to compensate for the luminance when OLED degradation takes place. Besides, the variation of threshold voltage is successfully detected. The average current error rate is 1.1% (∆V_TH±2 V). According to the simulation for 30 inch display, the second circuit has high stability at the four corners error rate which can improve the image quality. The last pixel circuit which is really simple in structure contains only 2 TFTs and 2 capacitors. It can not only compensate the deviation of driving TFT threshold voltage but also offer a reverse bias to alleviate OLED degradation during the period of the data input. Because of its simple structure, high yield and high aperture ratio are the unique features of the last pixel circuit. As for the last pixel circuit, the average current error rate is 2.4% (∆V_TH±0.33 V).
    In this study, we successfully proposed three pixel circuits to compensate for the degradation of TFT. We also utilized these pixel circuit to reduce the non-uniformity of OLED brightness. Overall, all pixel circuits were verified by SPICE and compared to other pixel circuits form reference journal papers.

    Abstract (in Chinese) I Abstract III Acknowledgement (in Chinese) VI Contents VII List of Tables X List of Figures XI Chapter 1 Introduction 1 1.1 Research Background 1 1.2 OLED Structure and Operation 5 1.3 Three Dimensional (3D) Displays 8 1.3.1 Overview of 3D Technology 8 1.3.2 Stereoscopic Displays 10 1.3.3 Emission Driving Scheme 12 1.4 Motivation 13 Chapter 2 AMOLED Pixel Circuit Driving Method 14 2.1 Driving Device 14 2.1.1 a-Si TFT 14 2.1.2 LTPS TFT 14 2.1.3 a-IGZO TFT 15 2.1.4 AIM-SPICE and Device Model 16 2.2 Compensating Methods for AMOLED 18 2.2.1 Threshold Voltage 19 2.2.2 Mobility 20 2.2.3 Voltage Drop 20 2.2.4 OLED Lifetime 21 Chapter 3 A Novel Pixel Circuit Using Reverse Bias and Compensate for OLED Degradation on 3D AMOLED Display 23 3.1 Introduction 23 3.2 Circuit Schematic and Operation 24 3.3 Simulation Results and Discussion 29 3.4 Summary 40 Chapter 4 A Novel a-IGZO Pixel Circuit Compensating for OLED Degradation and Voltage Drop on 3D AMOLED Display 42 4.1 Introduction 42 4.2 Circuit Schematic and Operation 44 4.3 Simulation Results and Discussion 49 4.4 Summary 56 Chapter 5 A Novel AC Driving Pixel Circuit Using Reverse Bias to Alleviate OLED Degradation for 3D AMOLED display 58 5.1 Introduction 58 5.2 Circuit Schematic and Operation 60 5.3 Simulation Results and Discussion 65 5.4 Summary 71 Chapter 6 Conclusions and Future Work 73 6.1 Conclusions 73 6.2 Future Work 75 References 76

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