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研究生: 陳宏達
Hung-da Chen
論文名稱: 產品服從韋伯壽命分配下之最佳單次檢驗策略
Optimal Single-Inspection Policies for an Item with Weibull Lifetime
指導教授: 葉瑞徽
Ruey-huei Yeh
口試委員: 羅士哲
Shih-che Lo
徐世輝
Shey-huei Sheu
學位類別: 碩士
Master
系所名稱: 管理學院 - 工業管理系
Department of Industrial Management
論文出版年: 2005
畢業學年度: 93
語文別: 英文
論文頁數: 34
中文關鍵詞: 單次檢驗置換貼現因子檢驗策略
外文關鍵詞: Discount Factor, Replacement, Single Inspection, Inspection Policy
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本篇論文研究隨機失效產品的最佳檢驗策略,考慮產品在使用期只執行唯一一次檢驗。在檢驗執行後,此產品不是進行矯正性置換就是進行預防性置換。此外,為了探討成本的時間價值對最佳單次檢驗策略的影響,在檢驗與置換的執行時間不可忽略的情形下,本論文建立了兩個檢驗模型。第一個模型忽略成本的時間價值,換言之,模型的建立排除了貼現因子。第二個模型則包含了貼現因子以將成本的時間價值納入考量。針對這兩個檢驗模型,除了對最佳檢驗時間的求算進行詳盡的探討外,同時建立了兩套演算法,藉以尋求這兩個模型的最佳單次檢驗策略。最後,在產品服從失效率遞增的韋伯分配下,藉由敏感度分析進一步觀察成本參數與貼現因子的變化對這兩個模型的最佳單次檢驗策略所造成的影響。


This thesis investigates the optimal inspection policies for a stochastically failing item with a single inspection during its lifetime. Following the inspection, the item must be replaced either correctively or preventively. Furthermore, to perceive the effects of the time value of cost on the optimal single-inspection policies, two inspection models are built, in which the time required for the inspection and replacement is non-negligible. The time value of cost in the first model is overlooked, that is, the discount factor is excluded from this model. The second model incorporates the discount factor to take the time value of cost into account. For both inspection models, the derivation of the optimal time epoch for inspection is discussed in detail and two algorithms are established to find their respective optimal single-inspection policies with ease. Finally, a sensitivity analysis is conducted to observe the effects of varying cost parameters and discount factor on the optimal single-inspection policies corresponding to these two models while the item follows the Weibull distribution with an increasing failure rate.

摘要 I Abstract II Acknowledgments III Contents IV List of Figures VI List of Tables VII 1 Introduction 1 1.1 Background 1 1.2 Literature Reviews 1 1.3 Potential Issues 3 1.4 Purposes and Framework 4 2 System Description 6 2.1 Item Features 6 2.2 Inspection Scheme 7 2.3 Log-concave Function 8 3 Inspection Model Without Discount Factor 9 3.1 Mathematical Modeling 9 3.2 Derivation of an Optimal Time Epoch for Inspection 10 3.3 Procedure for Computing an Optimal Time Epoch for Inspection 13 4 Inspection Model with Discount Factor 16 4.1 Mathematical Modeling 16 4.2 Derivation of an Optimal Time Epoch for Inspection 17 4.3 Procedure for Computing an Optimal Time Epoch for Inspection 22 5 Numerical Analysis 24 5.1 Parameter Settings 24 5.2 Sensitivity Analysis for Model 1 25 5.3 Sensitivity Analysis for Model 2 27 6 Conclusion 30 6.1 Concluding Remarks 30 6.2 Potential Topics for Future Research 30 References 32 About the Author 34

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