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研究生: 郭驥
Chi Kuo
論文名稱: 基於改良深度學習模型之PCB瑕疵檢測
PCB Defect Detection Based on Improved Deep Learning Model
指導教授: 曾世賢
Shih-Hsien Tseng
口試委員: 王孔政
Kung-Jeng Wang
賴正育
Cheng-Yu Lai
學位類別: 碩士
Master
系所名稱: 管理學院 - 工業管理系
Department of Industrial Management
論文出版年: 2023
畢業學年度: 111
語文別: 英文
論文頁數: 42
中文關鍵詞: 印刷電路板瑕疵檢測深度學習
外文關鍵詞: Printed circuit boards, Defect detection, Deep learning, YOLOv5
相關次數: 點閱:261下載:9
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  • Printed Circuit Boards (PCBs)為電子產品中關鍵的零件之一,為了確保電子產品長期使用和穩定性能,PCB瑕疵檢測為關鍵一環。現有PCB瑕疵檢測深度學習模型在精度上取得良好成績,然而卻未考量到模型大小以及即時性。因此,本研究旨在基於YOLOv5模型進行改進,提出了精準且快速的輕量化瑕疵檢測模型CCG-YOLO。本研究引入C3HB模組改良骨幹網路,通過空間交互作用強化特徵提取能力。在特徵融合網路中引入GSConv輕量卷積結構,在保持模型性能下大幅縮減模型參數。為了更進一步提升模型性能,本研究引入基於ConvNeXt網路之CNeB模組替換Neck中C3模組,CNeB在高效殘差網路設計下,不僅提高了模型檢測精度,更能減少模型參數量。綜合上述操作,本研究提出模型在TDD-Net公開數據集上,模型準確度mAP@0.5達到99.5%以及mAP@0.5:0.95達到88.75%。和原YOLOv5s算法相比在mAP@0.5:0.95上升4.24%,模型Size下降1MB,參數量減少0.472M,計算複雜度下降了0.6GFLOPs,即時推理速度達到120 FPS。實驗結果表明,本研究提出模型在PCB瑕疵檢測上精度高、速度快且模型體積小,能輕易佈署至低階設備同時滿足工業瑕疵檢測上即時性需求。


    Printed Circuit Boards (PCBs) are one of the critical components in electronic products. To ensure the long-term use and stable performance of these products, PCB defect detection is a key process. While the existing deep learning models for PCB defect detection have achieved good results in terms of accuracy, they have not taken into account the model size and real-time processing ability. Therefore, this study proposes a precise and fast lightweight defect detection model based on an improved YOLOv5 model called CCG-YOLO. Firstly, the backbone network is improved by adding a C3HB module, which enhances the feature extraction ability through spatial interaction capability. Secondly, this study introduces a lightweight convolution structure, GSConv, in the feature fusion network, significantly reducing model parameters while maintaining performance. Lastly, to further improve model performance, a CNeB module based on ConvNeXt network is introduced to replace the C3 module in the Neck. Designed with efficient residual networking, CNeB not only improves model detection accuracy but also reduces the number of model parameters. By combining these operations, CCG-YOLO achieved a mean average precision (mAP@0.5) of 99.5% and 88.75% in mAP@0.5:0.95 on the TDD-Net public dataset. Compared with the original YOLOv5s algorithm, the improvement in mAP@0.5:0.95 was 4.24%, the model size was reduced by 1MB, the number of parameters was decreased by 0.472M, computational complexity was reduced by 0.6GFLOPs, and the real-time inference speed reached 120 FPS. The experimental results show that the model proposed in this study is highly accurate, fast, and has a small model size for PCB defect detection. Furthermore, CCG-YOLO can easily be deployed to low-end devices and meet the real-time requirements of industrial defect detection.

    摘要 I Abstract II Contents III List of figures V List of tables VI Chapter 1 Introduction 1 1.1 Research background 1 1.2 Motivation 3 1.3 Research objective 4 Chapter 2 Literature review 5 2.1 Convolutional Neural Network (CNN) 5 2.2 Object detection 9 2.3 YOLO 11 2.4 Related work 14 2.5 Research gap 16 Chapter 3 Methodology 18 3.1 YOLOv5 algorithm 18 3.2 C3HB module 20 3.3 GSConv module 22 3.4 CNeB module 24 3.5 Proposed model 25 Chapter 4 Experimental results and analysis 28 4.1 Dataset description 28 4.2 Model training and experimental configuration 30 4.3 Evaluation metrics 30 4.4 Results from defect detection evaluation 32 4.5 Ablation experiment 34 4.6 Comparison with STOA algorithms 35 Chapter 5 Conclusion 37 References 39

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