觸控技術的進步以及廣泛的應用，日常生活中已有無以計數的地方可以看到使用的成果，然而觸控面板低價化在於材料成本的控制與製程良率，在此同時必須同時控制其品質避免劣質品或已有趨劣現象之劣質品誤認為良品使用，用一般傳統電測方式或是人工觸控檢測，往往無法發現潛在問題，誤判為良品並進行貼合組裝成終端產品(例如手機，平板電腦，筆記型電腦等)，而在日後發現其不良，使其結合之終端產品變為瑕疵品或不良品，造成更大的損失(損失甚至超過本身觸控板價值) 。
本文的目的在於利用程式演算的方式，針對多樣化的電容式觸控面板(touch screen )，以各電極節點(node)送電測後的回傳資料(Raw Data)進行分析交叉比對，確立出touch sensor 的各項特性並且加以數值分析，在觸控面板未進行產品應用組裝前，發現異常或潛在性問題進而攔下不良品，達到協助觸控面板製造廠商控制管理產品良率的重要目標。

Advances in touch technology and a wide range of applications can be found in countless places in daily life. However the touch panel cost reduction lies in the material cost control and process yield, while controlling the quality during the production to avoid mistaken for yield. With the general approach by testing device or human inspection, are often unable to identify potential problems. Mistaken for yield and assembled into end products (such as mobile phones, tablet PCs, notebook computers, etc.), and then find the defect in the future of the end products, resulting in greater losses (even more than the value of touch panel itself).
The purpose of this study is to use algorithm programming, to cross compare the raw data of each electrode node returns, for a variety of capacitive touch panel (touch screen), and establish the characteristic of touch sensor. By detecting potential problems before product assembly to achieve high production yield for the touch panel manufacturers.

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