研究生: |
游逸 Yuan - Yu |
---|---|
論文名稱: |
結合派翠網路(Petri Nets)與本體語意(Ontology)應用於產品公差設計與製程品質改善之研究 Combination Petri Net & Ontology Application on Tolerance Analysis and Quality Improvement of Manufacturing Process |
指導教授: |
林榮慶
Zone-Ching Lin |
口試委員: |
許覺良
none 傅光華 none |
學位類別: |
碩士 Master |
系所名稱: |
工程學院 - 機械工程系 Department of Mechanical Engineering |
論文出版年: | 2005 |
畢業學年度: | 93 |
語文別: | 中文 |
論文頁數: | 126 |
中文關鍵詞: | 尺寸迴路 、尺寸鏈 、公差設計 、本體語意 、派翠網路 |
外文關鍵詞: | Ontology, Petri Nets, Constraint Map, Dimension Loop, Tolerance Analysis |
相關次數: | 點閱:425 下載:2 |
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摘要
在產品研發設計過程中尺寸公差的設定與累積公差的分析一直是研發人員努力的課題,而生產製造端的製程能力與設計者定義或期望的尺寸公差往往有一定的落差。本研究結合派翠網路(Petri Nets)與本體語意(Ontology)的理論加以應用發揮,進而提出一套改善產品品質與縮短開發時程的公差設計手法。從創新的功能尺寸關聯圖(Constraint Map)應用到尺寸鏈(Dimension Loop)的建立,並利用均方根統計方法Root Sum of Square(RSS)作累積公差之計算分析,以簡易的Excel統計表格計算出符合6 Sigma品質需求的合理設計公差。
本研究以行動電話產品上下蓋間隙設計為案例研討,從設計階段的零件公差分析開始探討,從累積公差的分析一直做到試產問題解決與品質良率的驗證。並以實際開模的試模品做案例驗證,從第一次試模開始做FAI(首件尺寸量測) 、Cpk(製程能力指標)的量測、並以Cpk的值做為品質良率的推估依據,以提供修改設計或模具尺寸之參考,並詳細的介紹如何利用本研究之創新Constraint Map正確而快速的找到問題的根源,進而一次就能把問題澈底給解決,此創研的手法提供設計者尊循的法則,不必盲目的修改,能有效的減少修改次數與節省成本進而縮短開發時程。
Abstract
Through the product design process, the setting of tolerance and the cumulative tolerance are always what Research & Development strive for. There is a definite distance in tolerance between what the production is capable of and what the designers expect. This research implements the Petri Nets and the theory of Ontology to propose a more efficient tolerance design technique. Applying the Constraint Map to establish the Dimension Loop and using the Root Sum of Square (RSS) to calculate the cumulative tolerance can produce a reasonable tolerance by programming a simple Excel chart.
This research takes the gap between a mobile phone’s Top & Bottom Covers as a case study. The study goes from the tolerance of the parts in the design phase, the analysis for the cumulative tolerance, to its pilot run phase and testing for its yield rate. Taking the actual tooling samples for testing, from doing FAI in the first Tooling phase, measurement for the Cpk, and the yield rate based on the Cpk; these numbers provide references for modifying the design or dimensions of the molds. This research provides the pioneer Constraint Map that accurately and efficiently solves the problems from the start. The designers can follow this method to shorten the development time and possibility to revise the molds.
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