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研究生： 黃奕翔
Yi-Hsiang Huang
論文名稱： 電容型高解析度太陽光電板特性曲線掃描器
Capacitive-type High-resolution Characteristic Curve Tracer for PV Panel
指導教授： 呂錦山
Ching-Shan Leu
口試委員: 楊宗銘
Chung-Ming Young
林瑞禮
Ray-Lee Lin
榮世良
Shih-Linga Jung
劉光華
Kwang-Hwa Liu
學位類別： 碩士
Master
系所名稱： 電資學院 - 電機工程系
Department of Electrical Engineering
論文出版年： 2012
畢業學年度： 100
語文別： 英文
論文頁數： 89
中文關鍵詞： 電流-電壓曲線、功率-電壓曲線、電容型特性曲線掃描器 (MPP)、最大功率點、最大功率追蹤器 (MPPT)
外文關鍵詞： maximum power point (MPP), capacitive I-V curve tracer, P-V curve
相關次數： 點閱：170  下載：3 
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    • 為量測太陽能光電板之電流-電壓特性曲線，特性曲線掃描器已在許多文章中被提出。如: 可變電阻型、電子負載型、直流-直流轉換器型、雙極性功率放大器型、四象限電源供應器型和電容型特性曲線掃描器。
    在上述之中，電容型特性曲線掃描器具有其他特性曲線掃描器所沒有的優點: 電路架構簡單、掃描速度快、具自動掃描、熱損耗低、體積小以及成本低。
    然而，因其掃描速度快，導致在電流-電壓特性曲線上，最大功率點周圍的取樣率不足。為增加最大功率點周圍的取樣點，本文提出了一個電容型高解析度太陽光電板特性曲線掃描器。透過一個簡單的控制電路，控制一個並聯在充電迴路旁的子電路。已達成延長最大功率點周圍的掃描時間。因此，資料存取系統便能擷取到更多的取樣點。
    為了確認所提出之電路的功能，其模擬及實驗結果已在本文中詳述。另一方面，此電路不僅能量測太陽光電板在均勻照度下操作時的特性曲線，也具有量測操作在部分遮蔽情況下之特性曲線的能力。

    To trace I-V characteristic of PV panels, several I-V curve tracer are proposed including variable resistors, electronic loads, DC-DC converters, bipolar power amplifiers, four-quadrant power supplies and capacitive load I-V curve tracers.
    Among them, the capacitive I-V curve tracer has several advantages over the others: simple circuit, fast measurement speed, automatic sweep, low heat dissipation, compact size, and low cost.
    However, it sweeps too quickly to collect the data in lacking of insufficient sampling resolution around the MPP operating regions. To increase the sampling resolution, a capacitive-type high-resolution characteristic curve tracer for PV panel is proposed to extend the sweep time around the MPP regions by adding a charging-current shunt sub-circuit with simple control. Consequently, more I-V sampling points can be captured by the analog to digital (ADC) device.
    To confirm the function of the capacitive-type high-resolution characteristic curve tracer for PV panel, the simlution and the experimental results are also proveded. Further, additional modification of the proposed curve tracer is made to measure the I-V curve with multiple-peak power points under partial shading condition.

    Abstract I Acknowledgements II Table of Contents III List of Figures V List of Tables IX Chapter 1 Introduction 1 1.1 Background and Motivation 1 1.2 Objectives of the Thesis 11 1.3 Organization of the Thesis 11 Chapter 2 Analysis of Conventional Capacitive I-V Curve Tracer 12 2.1 Introduction 12 2.2 Circuit Structure 15 2.3 Operated Principle 17 2.4 Circuit Design 21 2.5 Circuit Simulation 22 2.6 Experimental Results 27 2.7 Summary 32 Chapter 3 Capacitive-type high-resolution characteristic curve tracer 33 3.1 Introduction 33 3.2 Circuit Structure 35 3.3 Operated Principle 41 3.4 Circuit Design 56 3.5 Circuit Simulation 59 3.6 Experimental Results 66 3.7 Summary 71 Chapter 4 Conclusions and future researches 72 4.1 Conclusion 72 4.2 Future Research 73 References 74 Vita 79

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