研究生: |
黃偉誠 Wei-Chen Huang |
---|---|
論文名稱: |
互補式振盪器注入鎖定倍頻器與倍頻器之熱載子應力分析 Injection-Locked Frequency Multiplier Based on a Complementary Oscillator and Analysis of Hot-Carrier-Stressed Switching-Mode Injection-Locked Frequency Multiplier |
指導教授: |
張勝良
Sheng-Lyang Jang |
口試委員: |
張勝良
Sheng-Lyang Jang 黃進芳 Jhin-Fang Huang 賴文政 Wen-Cheng Lai 徐茂修 Mao-Hsiu Hsu |
學位類別: |
碩士 Master |
系所名稱: |
電資學院 - 電子工程系 Department of Electronic and Computer Engineering |
論文出版年: | 2022 |
畢業學年度: | 110 |
語文別: | 英文 |
論文頁數: | 116 |
中文關鍵詞: | 倍頻器 、熱載子 |
外文關鍵詞: | Multiplier, Hot-Carrier |
相關次數: | 點閱:211 下載:12 |
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在無線通訊快速發展中,鎖相迴路扮演著重要的角色,典型的鎖相迴路由相位偵測器或相位頻率偵測器、充電汞、迴路濾波器、壓控振盪器和除頻器所構成。此外,為了降低單一壓控震盪器操作在高震盪頻率的難度,目前系統常用的是壓控震盪器加上倍頻器,設計較為簡單穩定,整體相位雜訊也較好。
章節三設計倍三注入鎖定電路(ILFT),晶片面積為0.788 × 1.118 mm2,本架構提出一種新型單極ILFT,結合了互補式ILO和混頻型雙端注入三倍頻器。ILFT使用雙端注入,互補ILO使用一個NMOS和一個PMOS交叉耦合使其在較低功率下提供負阻抗,透過單端注入來當作多模數注入鎖定倍頻器ILFM。
章節四設計BiCMOS ILFT,晶片面積為1.18 × 1.2 mm2。此電路使用兩個SiGe HBT作為交叉耦合注入鎖定 三倍頻器ILFT中的雙端注入元件與交叉耦合振盪器的諧振迴路並聯。
章節五研究熱載子應力對注入鎖定三倍頻器 ILFT的影響,晶片面積為 1.2×1.18 mm2。ILFT 採用開關式振盪器設計,應力電壓為 2.1 V,用於加速退化過程。此設定會降低鎖定範圍和相位雜訊。
With the rapid development of wireless communication, phase-locked loop plays a crucial role. Typically, the phase-locked loop is composed of phase detector or phase frequency detector, charge pump, loop filter, voltage-controlled oscillator and frequency divider. In addition, to reduce the challenges of high operating frequency with single phase-locked loop. The solution to it is using ILFM added to VCO. It makes the design easy with higher phase noise behavior.
Chapter 3 shows a new single-stage ILFT, combining a complementary ILO and a mixer-type shunt-injection frequency tripler. The ILFT uses the differential injection. The complementary ILO uses one NMOS and one PMOS cross-coupled to provide a negative resistance at lower power. The power consumption reduces because PMOS is in series and limits the current when injection FETs are on. This circuit is used as a multi-modulus ILFM by applying one phase injection as well.
Chapter 4 presents shunt-injection ILFTs. Two SiGe HBT are used as shunt injection devices in a cross-coupled injection-locked frequency tripler (ILFT). This design is a 0.18 μm BiCMOS injection locked frequency tripler using SiGe HBT injection devices in shunt with cross-coupled oscillator’s tank.
Chapter 5 studies the hot-carrier stress effect on an injection-locked frequency tripler (ILFT) in the TSMC 0.18 μm BiCMOS process. The die area is 1.2×1.18 mm2. The ILFT was designed with switching mode oscillator, and stress supply voltage is 2.1 V for accelerating the degradation process. The over-voltage bias degrades both the locking range and the phase noise.
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