本研究分別以模擬及實驗方式探討電雙層與Stern Layer 內電壓分布行為，模擬使用CFD-ACE+工程分析軟體於流動、化學、電模組下進行穩態(Steady state) 的電壓分布分析，實驗使用原子力顯微鏡(Atomic force microscope, AFM)進行量測，其原理主要是將探針在掃瞄過程中所測得的力轉換為電壓值，對於往往尺寸只有數奈米甚至數埃(Å)的Stern Layer，原子力顯微鏡(AFM)具有可於液相環境中工作且成像解析度達數埃(Å)等級的優勢，實驗將於不同的電解液濃度中做多次的量測，其目的是為了改變探針掃描時所受到的凡德瓦力(Van der waals force)及靜電力(Electrostatic force)，進而精準的分析出探針受力情形再轉換為電壓。
實驗結果成功地在七種電解液濃度下，將原子力顯微鏡所測得的力與距離曲線轉換為電壓分布。結果顯示：Stern Layer的厚度皆為約0.5nm，擴散層(Diffusion Layer)厚度為1.75~8.89nm；極板表面電位為54.94~105.04mV，界達電位(Zeta Potential)為16.88~38.23mV，與大多界達電位量測相關文獻之結果有相同之處，皆為mV等級。

The research is to study voltage distribution of Stern Layer by simulation and experiment. For simulation, we chose flow, chemical and electrical models in steady state and computed with software CFD-ACE+ . For experiment, Atomic Force Microscope(AFM) is used, because of extremely small size of stern layer(Nanometer or Angstrom), in order to get accurate force curve, we made many measurements in different concentrations of electrolyte by probe, and discussed the forces(Van der waals force and Electrostatic force) acting on probe in liquid, then transform force curve to voltage curve.
From the experimental results in seven concentrations, the thickness
of stern layer are almost same(About 0.5nm), and diffusion layer are 1.75~8.89nm, voltage of electrode surface are 54.94~105.04mV, Zeta Potential are 16.88~38.23mV which have same region(Below 80nm) with many relevant Literatures.

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