本論文旨在討論自動測試機台(Automatic Test Equipment, ATE)在奈秒尺度切換特性(Switching Characteristics)的錯誤關聯性，也就是量測結果和規格書定義的典型值有一個差距，經由研究和實驗將其更正。並以應用在泰瑞逹(Teradyne)的ETS-364 ATE來針對SN65LBC180這一顆差分驅動和接收的積體電路測試為例。SN65LBC180在IMPACT ATE 從事生產，而IMPACT ATE是一個傳統測試平台，有著較低的生產率(Productivity)、維護困難、所佔的空間較大，以及每次只能測試一顆產品(Single Site Testing)的缺點。在測試平台轉移(Tester Platform to Platform Conversion) 這個案子中，順利把SN65LBC180從IMPACT ATE轉移到ETS-364 ATE。轉換過程中在ETS-364 ATE發現奈秒切換特性的量測超出了規格書(Datasheet)的規範，進行研究找到原因並提出解決方式後，除了維持依然97%以上的測試良率外，每次也可以同時測試四顆產品來大大降低測試成本(Cost of Test, COT)，最後順利轉換到生產線量產。

This thesis presents the miscorrelation of nanosecond-scale switching characteristics measurements between ATE and the typical values in datasheet, and the correction after study and experiments. We implemented into Teradyne’s ETS-364 ATE for the differential driver and receiver pair integrated circuit(IC) SN65LBC180. SN65LBC180 was produced in IMPACT ATE, which is a legacy tester platform with a lower productivity, difficult for maintenance, occupied huge space and tested in single site only. In the tester platform to platform conversion project, SN65LBC180 was successfully converted from IMPACT ATE to ETS-364 ATE. During this conversion, the characteristics measurements are out of the specification of the datasheet, studied to dig out the root cause and provided a solution to fix. It was released into the production line with not only the test yield is greater than 97%, which is the same as IMPACT ATE, but also reduced the cost of test (COT) by quad-site testing.

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