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研究生: 吳展岦
Jhan-Li Wu
論文名稱: 低成本探針開發及驗證
Development and Validation of Low-cost Probe
指導教授: 李維楨
Wei-Chen Lee
口試委員: 王蒼容
Chun-Long Wang
曾昭雄
Chao-Hsiung Tseng
學位類別: 碩士
Master
系所名稱: 工程學院 - 機械工程系
Department of Mechanical Engineering
論文出版年: 2016
畢業學年度: 104
語文別: 中文
論文頁數: 55
中文關鍵詞: 探針電磁分析
外文關鍵詞: Probe, Electromagnetic analysis
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  • 本論文為了解決微波探針量測成本過高及其量測接腳脆弱,所以開發量測成本低、可重複使用以及有堅固量測接腳之探針。探針是利用市面上常見之SMA接頭母-母(R)型改良而成,分別開發兩種版本,二者主要差異為兩邊接腳與中心針的間距可加工調整與否,自製探針1可以藉由加工技術調整間距大小。接著使用微波探針及兩種自製探針進行量測比較,並於量測前利用SOLT校正方法移除探針之電氣效應,最後以CST Microwave Studio電磁分析軟體驗證實際量測結果。兩種自製探針量測結果差異不大,二者介入損失於頻率10 GHz相差0.11 dB,自製探針2略優於自製探針1。量測頻率0~10 GHz中,反射損失皆位於-20 dB以下。與微波探針相比,兩種自製探針與微波探針在介入損失及反射損失量測結果之損失值差異不大。我們進一步透過電磁分析軟體模擬不同的基於SMA的探針金屬外殼、中心針結構與鐵氟龍構造之影響,發現銅金屬不能設計於電磁波傳遞路徑上,以免阻擋電磁波的傳遞。中心針切半對電磁波傳遞影響不大,切半的中心針結構反而有利於實際量測的進行。不當地增加或減少鐵氟龍也會大幅影響電磁波的傳遞,造成能量的損失。


    This paper not only focus on the high measurement cost and weak measurement pins of microwave probe, but also focus on the signal integration problem of SMA at solder place. Therefore, we develop the two different types of probe that contain lower measurement cost, reusable and strong measurement pins. Both of them made from common market’s SMA female-female(R) type connector. The main difference of them is the gaps that between middle signal pin and two ground pins. The improve probe1 can adjust the gaps by manufacturing technique. Furthermore, we took SOLT calibration method to eliminate the probe’s electrical effect before measurement, then we compared the measurement results of microwave probe and two improve probes. Finally, we used the CST Microwave Studio electromagnetic analysis software to test and verify the measurement results. As the S parameters results show that there was a difference of insertion loss about 0.11 dB or so at 10 GHz frequency, and under -20 dB of return loss during measuring frequency 0~10 GHz. So the measurement ability of improve probe2 is a little bit better than improve probe1. In consequence, there were similar S parameters results between microwave probe and two improve probes.
    This paper also discussed that structure of SMA about different copper shell, middle signal pin and Teflon effect. In order to avoid that obstruct the energy pass, we can’t design copper shell on a path of electromagnetic waves transmission. The half middle signal pin is an easy way for measurement process, and it doesn’t quite impact the measurement results. Modify the Teflon material structure will cause the significant energy loss.

    摘要 I Abstract II 誌謝 III 圖目錄 VI 表目錄 IX 第一章 緒論 1 1-1 研究動機 1 1-2 文獻回顧 3 1-3 研究目的 8 第二章 量測方法 9 2-1 量測治具與待測物 9 2-2 量測前之校正 21 2-2-1 SOLT校正 21 2-2-2 探針校正 22 第三章 實測及模擬 26 3-1 微波探針實測 27 3-2 自製探針1與自製探針2 28 3-2-1 自製探針1及自製探針2實測結果 28 3-2-2 自製探針1及自製探針2模擬結果 31 3-2-3 實測與模擬結果比較 33 3-3 微波探針與自製探針實測結果比較 35 3-4 結果分析 38 第四章 模擬不同SMA結構 40 4-1 外殼銅金屬影響 41 4-2 中心針切半影響 43 4-3 鐵氟龍影響 45 4-4 結果討論 52 第五章 結論與未來展望 53 5-1 結論 53 5-2 未來展望 54 參考文獻 55

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