發光二極體光學產品常需要二次光學元件來搭配，設計出產品所需求的光學特性，因此二次光學元件設計日益受到人們重視。二次光學元件設計現今存在發光二極體晶粒成像問題和黃圈現象。本論文將針對上述兩點問題作探討，二次光學元件部份以TIR Lens為基礎架構，驗證光路徑屬點對點和點對面的兩款透鏡和發光二極體晶粒成像問題之關係，透過光學軟體TracePro模擬並進行分析和開模量測。由於發光二極體本身製程關係，所以搭配二次光學元件衍生的黃圈現象是不可避免的，本文利用色彩學中的色差概念來給予黃圈定量，建立一套簡易判斷黃圈嚴重程度的方法。

For various applications designers often use secondary optical elements of LEDs to make proper adjustments of the optical properties. Therefore secondary optical design is more important. Secondary optical designs for LEDs have to deal with Die-Imaging and Yellow Hue phenomena. In this literature signal optical element LED with a TIR Lens, issued. First part is focus on the relationship between the die-imaging phenomenon and the TIR lens design of point-to-point and point-to-plane. Producing yellow hue phenomenon in secondary optical design is unavoidable because the LEDs with defects in the manufacture. Our goal is to simulate a TIR lens with a white LED by TracePro. For identifying the seriousness of yellow hue phenomenon we via color difference method. Set up a set of simple and easy method to make a diagnosis.

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