本研究係針對TFT-LCD面板的壽命或稱平均故障間隔時間(MTBF, Mean Ttime Between Failures)做分析，探討內容包含利用實驗室可靠度加速壽命鑑定試驗之失效數據及市場不良品反饋的資料做壽命分析。
首先針對某特定14.1吋筆記型電腦之TFT-LCD面板於產品開發階段完成，但尚未量產前，隨機抽取試作線小量試產品100片，於實驗室以高溫加速模式，採用固定時間檢剔數據(Type I Censored Date)，將所得到之試驗失效數據，利用Arrhenius加速壽命模式，轉換為正常使用下之失效時間後，再利用圖形最小平方法做線性迴歸，找出相關係數(Correlation Coefficient)最高之分佈。並另以最大概似法(Max Likelihood Estimate)找出該失效分佈函數之參數，計算出產品可靠度鑑定試驗壽命值。
另也針對同型之TFT-LCD面板於量產銷售階段，所銷售約182萬片面板，於不同之時間區間，客戶退回維修中心所蒐集而得約3600筆失效數據，利用Kaplan – Meier方法之無母數分佈存活分析，探討TFT-LCD Panel的存活函數(Survival Function)及變異數估計(Variance Estimation)。然後，同上，利用圖形最小平方法做線性迴歸及最大概似法找出分佈之參數，計算出產品之壽命值。
最後本文將探討可靠度鑑定試驗壽命值與市場失效資料分析所求得的壽命值兩者之間的關係與差異原因。

The calculation of MTBF (mean time between failures) is very important in reliability life data analysis. For different distributions, the values of mean time between failures are always different. This paper uses two different approaches to obtain the TFT-LCD panel life, one is the accelerated demonstration life testing which is performed at the reliability lab during the panel development stage, the other approach is to collect the filed return data from the repair center.
In this paper, we collect both of the accelerated demonstration life testing data and filed return data through the repair center for one 14.1” TFT-LCD panel. The least square method is used for the linear regression to get the correlation coefficient from the different distributions, including the Weibull distribution, normal distribution, lognormal distribution and exponential distribution. The distribution of the maximum correlation coefficient is chosen for the optimum TFT-LCD panel life distribution. We also use the max likelihood estimates to get the parameters of the distribution and calculate the panel life value.
The deviation of the life value between the accelerated demonstration life testing and field return data is also discussed in this paper.

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