本論文進行了兩項與天線量測系統相關的研究。第一部分為改善先前研究中所提出可以測量天線反射係數大小的天線匹配量測系統之效能。我們選用高精確度的資料擷取與控制卡，並利用LabView撰寫控制程式達到自動化的功能，可以大大提升量測效率，並將核心元件以方向耦合器取代舊有的環行器，可以達到縮小體積和降低成本的效果。
第二部分提出一個平面線性掃描天線場型量測系統的架構。隨著無線通訊的快速發展，我們可以預期新的無線應用標準的射頻頻率會更有可能採取毫米波頻段，因此天線場型的量測是必要的。為了克服60 GHz以上的S參數量測必須使用大體積和重量重的混波器，本研究因此利用線性掃描平台的方式來做傳輸量測，透過位置轉換的訊號處理將線性平面結果轉換為球面掃描結果，以及加入位置修正項來校正天線的擺放位置。本論文所提出的天線場型量測系統可藉由改變天線間距來調整掃描角度，適合毫米波頻段指向性天線的量測。

In this thesis, we proposed two topics related to the antenna measurement systems. The first part focuses on performance improvement of an antenna matching testing system developed in previous work. The system can evaluate impedance matching conditions of one port devices. In the improved system, a high-precision data acquisition and control card is used. LabView programs are also developed to realizer system automation. Measurement speed, stability and precision are enhanced. The directional coupler, which is more compact and economical, is used to replace the circulator, while maintain similar system performance.
In the second part, we proposed a planar scanning farfield antenna pattern measurement range. As wireless communication techniques progress, we can expect that new wireless standards are more likely to use the millimeter wave band. Antenna pattern measurement ranges that fit the millimeter antenna evaluation needs are required. In order to cope with the large and heavy mixer used above 60 GHz, planar 2-dimentional linear scanner can be used to perform the transmission measurement. Linearly scanned results can be transformed to fields on a spherical surface. By calibrating the effects of the sampling probe, the desired 3-dimentional pattern of the antenna-under-test can be derived. This system is suitable for directional antennas in the millimeter wave band and is easy to control.

[1] 徐紹恩, 平面式波束掃描天線與天線阻抗量測裝置開發, 國立台灣科技大學電機工程研究所, 碩士論文, 民國99年.
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