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研究生: 杜憲宗
Hsien-Tsung Tu
論文名稱: 運用C_puA於單邊製程規格線性剖面資料之抽樣計畫
Applying C_puA for Sampling Plans for Linear Profiles with One-Sided
指導教授: 王福琨
Fu-Kwun Wang
口試委員: 林希偉
Shi-Woei Lin
羅士哲
Shih-Che Lo
學位類別: 碩士
Master
系所名稱: 管理學院 - 工業管理系
Department of Industrial Management
論文出版年: 2015
畢業學年度: 103
語文別: 中文
論文頁數: 42
中文關鍵詞: 供應商選擇製程選擇線性剖面單邊製程規格抽樣計畫
外文關鍵詞: Supplier selection, Process selection, Linear profiles, One-sided specifications, Sampling plan
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在許多工業應用中,製程或產品的品質特徵可被用一個反應變數和一個或多個解釋變量之間的特殊關係解釋之,則稱為剖面資料。本研究主要探討在多家供應商中,選擇具有較高製程能力的供應商,其產品製程具有線性剖面資料特性,並且是以單邊製程規格為製程能力標準。我們提出基於抽樣計畫的方法,在此情況下利用允收品質水準(AQL)及最低允收水準(LTPD),使用生產者風險及消費者風險,比較作業曲線上兩點(AQL,1-α)以及(LTPD,β),計算出檢定所需的臨界值,作為供應商選擇決策的依據,這些資訊能有效地幫助決策者來處理此類型的供應商選擇問題。


In many industrial applications, process or product quality characteristics is explained by the special relationship between the variables and one or more explanatory variables, it is called profile. This study focused on the number of suppliers, the selection process has a high capacity supplier of product manufacturing process has a linear profile data characteristics, and process specifications are one-sided process capability. We propose a method based on the sampling plan, in this case the use of acceptable quality level (AQL) and lot tolerance percent defective (LTPD), the use of producer risk and consumer risk, to comparing operating characteristics curve (AQL, 1- α) and (LTPD, β), calculated verification required critical value, as supplier selection decisions based on that information can help decision makers to effectively deal with this type of supplier choice.

摘要 I Abstract II 誌謝 III 目錄 IV 圖目錄 VI 表目錄 VII 第一章 緒論 1 1.1 研究動機 1 1.2 研究目的 2 1.3 研究範圍與限制 2 1.4 研究流程 2 第二章 文獻探討 5 2.1 線性剖面資料 5 2.2 製程能力指標 7 2.3 單邊型線性剖面資料的製程能力指標C_puA 及C_plA 9 2.4 單邊製程規格的供應商選擇方法 10 2.5 多重比較法(Multiple comparison for the best, MCB) 11 2.6 抽樣計畫 13 2.6.1 抽樣計畫的使用 13 2.6.2 抽樣計畫運用於其他製程能力指標 14 第三章 研究方法 15 3.1製程能力指標C_puA 及C_plA應用在k(k≥2)個供應商選擇 15 3.2 檢定力分析 16 3.2.1 情況一:水準數不同的情況 16 3.2.2 情況二:剖面資料個數不同的情況 18 3.3 運用於單次允收抽樣計畫 21 第四章 案例分析 27 第五章 結論與建議 29 文獻參考 30 附錄 32 I.檢定力分析 32 II.計算允收抽樣計畫之樣本數及臨界值C_0之程式碼 35 III.模擬資料之程式碼 37 IV.各水準之模擬資料 39

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