本研究計畫旨在研發一多層式印刷電路板同心圓自動化光學檢測（AOI）系統，應用X-Ray以機器視覺技術與精密定位運動機構，搭配電控模組，研製此精密自動影像檢測系統。藉由搖桿控制兩軸運動平台，使待測物顯示於影像視窗中，並利用影像技術擷取待測物內層特徵影像，以影像處理與分析技術取得特徵點資訊，計算出各層資訊，以利品管作業。最後，透過影像學習功能建立位置資訊，再傳送運動指令使三軸定位機構進行定位工作以達到高精度自動化檢測目的，提昇物件定位精度、速度。

The purpose of this thesis is to develop an automatic optical inspection system for the multi-layout printed circuit board (PCB). The automatic machine vision inspection system integrates machine vision technology using X-Ray images, precise alignment motion mechanism and electrical control module. First, the two-axis motion plant is controlled by a joystick to make the images of the observed object in the inspection window. Second, the characteristic images are acquired through the CCD camera. In addition, the image information is extracted by means of the image processing technology. In this way, the information of each layer is figured out for the quality control procedure. Then, the position information is built based on the result of the image learning process. Finally, the precision alignment can be performed.

[1] M. Moganti, and F. Ercal, "Automatic PCB Inspection System," IEEE Potentials, Vol. 14, No. 3, pp.6-10(1995).
[2] H. Boerner, and H. Strecker, "Automated X-Ray Inspection of Aluminum Castings," IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 10, No.1, pp. 79-91(1998).
[3] K. Feldmann, and J. Sturm, "Closed Loop Quality Control in Printed Circuit Assembly," IEEE Transactions on Components, Vol. 17, No.2, pp. 270-276(1994).
[4] W. H. Schwartz, "Vision System for PC Board Inspection," Assembly Engineering, Vol. 29, No. 8, pp.18-21(1986).
[5] Trivedi, and P. C. H. Liu, "Machine Vision Processing/Selection in Printed Circuit Board Manufacturing," Proceedings of the Twenty-Ninth Southeastern Symposium on System Theory, pp.190-194(1997).
[6] B.H. Khalaj, H.K. Aghajan, and T. Kailath, "Automated Direct Patterned Wafer Inspection," IEEE Workshop on, pp.266-273(1992).
[7] 陳澤明，「印刷電路板自動化光學檢測系統研製」，國立台灣科技大學電子工程系碩士論文，民八十八年七月。
[8] J. Hudzik, "SMT Statistical Process Control Using Automatic X-Ray Inspection," Electronic Manufacturing Technology Symposium of Fifth IEEE/CHMT International, pp.215-220(1988).

[9] R.F. Hanke, and T. Weiss, N.Petsch, "Automated 3D X-Ray Inspection of Fine Pitch PCB's," Electronic Manufacturing Technology Symposium of Fifth IEEE/CHMT International, pp.187-190(1992).
[10] D. Bernard, and R.C. Blish, "Considerations for Minimizing Radiation Doses to Components During X-Ray Inspection," Electronic Manufacturing Technology Symposium of IEEE/CPMT/SEMI 28th International, pp.369-377(2003).
[11] Oriental Motor General Catalogue，台北，台灣東方馬達股份有限公司，民國九十三年。
[12] 林敬智，「鑽針芯厚量測系統之研製」，國立台灣科技大學機械工程系碩士論文，民國九十二年七月。
[13] 葉思武編著，「自動機械設計的慣性﹙GD2﹚問題」，台南夫子出版社，民國七十七年。
[14] 陳熹棣，「步進馬達應用技術」，台北，全華科技圖書，民國七十五年一月。
[15] 吳天佑，「步進馬達原理與實作」，Micro-Electronics, pp.236-240, June 1999。
[16] National Instruments, 7344/7334 Hardware User Manual, Austin, Texas, August 2001.
[17] 蔡明忠，「自動化感測與控制課程講義」，國立台灣科技大學自動化及控制研究所，民國九十三年。

[18] 廖文輝，周至宏編，洪英榮校閱，「圖形監控」，台北，全華科技圖書，民國八十九年二月。
[19] 廖志偉，「光學粒徑分析系統之研製」，國立台灣科技大學機械工程學系研究所碩士論文，民國九十二年七月。
[20] 鍾國亮，「影像處理與電腦視覺」，台北，東華書局，九十三年二月。
[21] 李淑惠，「X-Ray即時影像強化與瑕疵偵測之研究」，私立元智大學工業工程研究所碩士論文，民國九十年七月。
[22] National Instruments, "IMAQ PCI/PXI 1409 User Manual," National Instruments Corporation, Texas, 2000.
[23] 洪紀榮，「智慧型PCB微形鑽頭檢測機之研製」，國立台灣科技大學機械工程學系研究所碩士論文，民國九十年七月。
[24] 吳成柯、戴善榮、程湘君，雲立貴譯，「數位影像處理」，台北， 儒林書局，九十年十月。
[25] National Instruments, "IMAQ Vision Concepts Manual," National Instruments Corporation, Texas, 2000.
[26] 邱顯成，「鈦酸鍶變阻器外觀影像自動檢測之研究」，國立台灣科技大學機械工程學系研究所碩士論文，民國九十一年七月。
[27] 莊水發，「精密三軸影像自動定位系統之研究」，國立台灣科技大學機械工程學系研究所碩士論文，民國九十二年七月。
[28] 修芳仲，「高等精密量測課程講義」，國立台灣科技大學機械工程研究所，民國九十三年。