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研究生: 吳俊德
Chun-te Wu
論文名稱: Auto-ID Center Class-1 Generation 1標籤搜尋演算法及標籤晶片設計
Design of Tag Search Algorithm and Tag Chip with Auto-ID Center Class-1 Generation 1
指導教授: 王乃堅
Nai-Jian, Wang
口試委員: 楊成發
Chang-Fa, Yang
姚嘉瑜
Yao, Chia-Yu
鍾順平
Shun-Ping, Chung
張立中
Li-Chung, Chang
學位類別: 碩士
Master
系所名稱: 電資學院 - 電機工程系
Department of Electrical Engineering
論文出版年: 2006
畢業學年度: 94
語文別: 中文
論文頁數: 80
中文關鍵詞: 標籤防碰撞RFID
外文關鍵詞: tag, anti-collision, RFID
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  •   無線射頻系統(Radio Frequency Identification, RFID)近來已經成為未來最受歡迎的科技之一,因為電子標籤可藉著減少所需人力,在某些供應鏈或服務鏈等領域上取代傳統條碼系統的扮演的角色。
      在本篇論文裡,首先以Verilog硬體描述語言實現了一個符合Auto-ID Center所制定的Class-1標準的標籤電路模組,然後我們發展了一個完整的標籤搜尋演算法去辨識出存在於RFID Reader辨識區內的所有標籤,這個搜尋演算法可以有效地辨識標籤內的資訊,並在八秒鐘內完整辨識出多達600個標籤。最後,本論文提出了兩種方法對原始標籤架構進行部份修改,並且將焦點放在提昇RFID系統的搜尋效能。根據本論文的實驗結果顯示,經過修改的標籤架構與原先架構相比可以達到200%以上的性能提昇。


    Radio Frequency Identification (RFID) systems have become one of the most popular technologies recently. It can replace the traditional role of bar code system in the supply or service chain by reducing the needs of manpower.
    In this thesis, we first carry out a tag module by Verilog HDL that complied with Auto-ID Center Class-1 Standard. Then, a fully tag search algorithm is designed to work in a simple RFID reader to find out all the tags coexisting in the field of the RFID reader. This search algorithm queries the tags for identification information efficiently. It can identify up to six hundred tags in eight seconds. Finally, we propose two modifications about the original architecture and focus our attention on how to further reduce the use of logic gate to efficiently improve search performance. According to our experimental results, the modified architecture achieves 200% improvement over the original standard.

    中文摘要 I Abstract II 誌  謝 III 目  錄 IV 圖 目 錄 VI 表 目 錄 XI 第一章 緒 論 1 1.1 研究動機 1 1.2 RFID的現況及應用 1 1.3 相關研究 2 1.4 研究目的及方法 3 1.5 內容大綱 3 第二章 射頻辨識系統(RFID)介紹 5 2.1 RFID系統概述及系統組成 5 2.2 RFID系統的工作頻率與規範 6 2.3 RFID系統的動作原理 7 第三章 AUTO-ID Class-1標準規格介紹 9 3.1 860MHz-930MHz Class-1 Version 1.0.1 Protocol簡介 9 3.2 Reader至標籤資料的調變 10 3.3 Reader的指令種類與指令架構 11 3.3.1 Reader至標籤的指令格式 12 3.3.2 Reader至 標籤的指令集 13 3.3.3 標籤至Reader的指令格式 14 3.4 標籤至Reader的資料調變 16 第四章 標籤數位電路實現與標籤搜尋演算法 18 4.1 標籤內部數位電路架構 18 4.2 多標籤共存時之碰撞問題實驗 20 4.3 RFID Class-1 標籤指令測試 22 4.4 標籤搜尋演算法介紹 26 4.5 標籤 ID亂數分佈模型 31 4.6 實驗環境與平台 34 4.7 標籤搜尋演算法實驗結果 35 4.8 實驗結果分析 39 第五章 標籤架構研究 40 5.1 傳統Class-1 標籤架構之缺點與研究方向 40 5.1.1 Bin架構研究 41 5.1.2 Multi-Channel架構研究 45 5.2 搜尋演算法的變更 53 5.2.1 Bin搜尋演算法的變更 53 5.2.2 Multi-Channel搜尋演算法的變更 53 5.3 PingID指令Bin架構改進與性能比較 54 5.4 Multi-Channel架構研究與性能比較 63 5.5 實驗結果分析 72 第六章 結論與建議 75 6.1 結論 75 6.2 建議 76 參考文獻 77 作者簡介 80

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