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研究生: 王瓅平
Li-Ping Wang
論文名稱: 矽氯烷類分子於矽基材之自組裝行為研究
Self-assemble Behavior of Alkylsiloxane Molecules on Silicon-based Substrate
指導教授: 陳良益
Liang-Yih Chen
口試委員: 江志強
Jyh-Chiang Jiang
陳敏璋
Miin-Jang Chen
學位類別: 碩士
Master
系所名稱: 工程學院 - 化學工程系
Department of Chemical Engineering
論文出版年: 2021
畢業學年度: 109
語文別: 中文
論文頁數: 157
中文關鍵詞: 自組裝單分子膜矽氯烷分子區域選擇性原子層沉積技術
外文關鍵詞: self-assembled monolayers (SAMs), trichlorosilane, area selective atomic layer deposition (AS-ALD)
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  • 中文摘要 I Abstract II 致謝 IV 目錄 VI 圖目錄 VIII 表目錄 XII 第一章、 緒論 1 1-1 前言 1 1-2 研究動機與目的 3 第二章、 理論基礎與文獻回顧 5 2-1 半導體簡介 5 2-1-1 半導體概念與能帶圖 5 2-1-2 本質半導體及外質半導體 7 2-1-3 直接和非直接能隙半導體 9 2-1-4 半導體材料 10 2-2 奈米材料 12 2-2-1 奈米材料簡介 12 2-2-2 奈米尺度效應 14 2-2-3 奈米材料的應用 21 2-3 自組裝單分子膜(self-assembled monolayers, SAMs) 23 2-3-1 自組裝分子簡介 23 2-3-2 自組裝分子發展歷史 24 2-3-3 自組裝分子結構 26 2-3-4 自組裝分子機制 29 2-4 原子層沉積技術 (atomic layer deposition,ALD) 36 2-4-1 原子層沉積技術發展史 36 2-4-2 原子層沉積之成長機制 38 2-4-3 以自組裝分子膜為基礎的區域選擇性原子層沉積(area-selective atomic layer deposition,AS-ALD) 43 第三章、 實驗設計 50 3-1 實驗流程圖 50 3-2 實驗藥品 51 3-3 實驗分析儀器與原理 54 3-3-1 接觸角量測儀 (contact angle Meter) 54 3-3-2 橢圓偏振光儀 (Spectroscopic Ellipsometer,SE) 56 3-3-3 X 光光電子能譜儀 (X-ray Photoemission Spectroscopy, XPS) 60 3-3-4 原子力顯微鏡 (Atomic Force Microscope,AFM) 62 3-4 實驗步驟 65 3-4-1 液相方式沉積自組裝單分子膜 66 3-4-2 ALD 製程步驟 68 3-4-3 SAMs厚度量測方法 70 第四章、 結果與討論 72 4-1 建立標準的SAMs製程 72 4-1-1 空基板清潔製程 72 4-1-2 不同環境下進行SAMs披覆製程 76 4-2 探討具有不同中間鍊自組裝分子對矽基半導體材料的表面性質 81 4-2-1 不同溶劑對自組裝分子的接附分析 81 4-2-2 不同濃度對自組裝分子的接附分析 84 4-2-3 具有不同中間鏈自組裝分子接附機制探討 86 4-3 不同尾端官能基自組裝分子對矽基半導體材料的表面性質 98 4-3-1 不同溶劑對自組裝分子的接附分析 98 4-3-2 不同濃度對自組裝分子的接附分析 102 4-3-3 具有不同尾端官能基自組裝分子接附機制探討 104 4-4 以自組裝分子尾端官能基對矽基半導體選擇性沉積 114 4-4-1 以ALD進行選擇性沉積 114 4-4-2 比較ODTS和FOTS的差異 122 第五章、 結論 127 第六章、 參考文獻 129

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