創新文化對半導體良率績效的影響-台灣半導體產業分析

簡易檢索 / 詳目顯示

回結果列表

研究生：	王聰輝 Tsung-Huei Wang
論文名稱：	創新文化對半導體良率績效的影響-台灣半導體產業分析 The Effect of Innovative Organization Culture on Yield Ramping-The Analysis of Semiconductor Manufacturing in Taiwan
指導教授：	林維熊 Wei-Shong Lin
口試委員:	葉明義 Ming-Yih Yeh 何珮瑩 Pei-Ying Ho
學位類別：	碩士 Master
系所名稱：	管理學院 - 管理研究所 Graduate Institute of Management
論文出版年：	2005
畢業學年度：	93
語文別：	英文
論文頁數：	48
中文關鍵詞：	創新文化、半導體良率、良率提昇速度
外文關鍵詞：	Yield Ramp, Yield, Innovative Culture
相關次數：	點閱：207 下載：2
分享至:	分享至facebook 分享至twitter

查詢本校圖書館目錄查詢臺灣博碩士論文知識加值系統勘誤回報

創新文化是一門重要的研究課題，許多學者的探討，均顯現出創新文化能使得組織具有更好的競爭力。台灣半導體產業的快速發展，不僅提昇了台灣在全球的科技地位，並提供資訊電子產業蓬勃發展的基礎。然而隨著製程技術的不斷發展，產品生命週期的縮短，廠商利潤空間的壓縮。面對如此嚴峻的挑戰，台灣半導體廠商必須努力的尋求降低生產成本，縮短交貨期，加速縮短良率提昇的速度，以期快速因應市場的變遷。
於是本研究以創新文化的要素，來探討良率提昇績效。透過理論探討與實務經驗作出推論分析，創新文化的要素與良率提昇速度的互動與關係；並以之作為台灣半導體企業未來創新文化發展的參考。
研究結果顯示在台灣半導體企業，其創新文化要素與半導體良率提昇的速度具有高度關聯性。亦即透過創新文化的發展，確實可以協助半導體企業縮短良率提昇速度；而提高台灣半導體企業的競爭力來面對嚴峻的挑戰。

Organizational culture is becoming one of the major fields in organization theory in 1980s. There are also abundant researches in organizational culture discussing what kind of innovative culture is beneficial to make organization more innovative. The contribution of innovational organization to business performance is widely discussed. The firms such as Semiconductor industry is in a highly competitive world of fast changing technology. The rapid evolution of production process results in short product life cycle and the complexity of technology make it very challenge to achieve high yield.
The ability of organization to achieve mature yields in a highly competitive world enables the semiconductor manufacturing to improve control over their manufacturing processes, as well as increase their yields and device value — thus maximizing their ROI and lowering their manufacturing costs. To know what is the organizational culture could make organization more innovative and what kind of innovative culture is good for the semiconductor company to accelerate yield ramp is very important.
This thesis is the first study about how innovative culture and performance management affect semiconductor manufacturers’ yield ramp. This research reveals that the innovative culture and outcome performance management are very important in yield ramp. The innovative culture and outcome performance management will help semiconductor manufacturing company to achieve their yield ramp potentially great than 2X faster.

ABSTRACT --------------------------------------------------------I
ABSTRACT IN CHINESE --------------------------------------------II
ACKNOWLEDGEMENT -----------------------------------------------III
LIST OF FIGURES -------------------------------------------------V
LIST OF TABLES	 -----------------------------------------------VI
CHAPTER 1 Introduction-------------------------------------------1
1.1.Motivation---------------------------------------------------1
1.2.Research Purpose---------------------------------------------1
1.3.Research Process---------------------------------------------2
CHAPTER 2 Literature Review -------------------------------------3
2.1.General Dimensions of Organizational Culture-----------------4
2.2.Organization Culture and Innovation--------------------------7
2.3.Innovation and innovation Process----------------------------8
2.4.Markus‘s innovative culture Model---------------------------9
2.5.The semiconductor overview----------------------------------11
2.6.The challenges for the Semiconductor Manufacturing----------13
2.7.Yield Ramping in Semiconductor Manufacturing ---------------16
2.8.The role of rapid yield ramp in semiconductor --------------18
CHAPTER 3 Research Framework------------------------------------19
3.1.Innovative culture in an organization-----------------------22
3.2.Evaluating method for manager ------------------------------23
3.3.Investigation target ---------------------------------------25
3.4.Hypotheses--------------------------------------------------25
3.5.Measurement-------------------------------------------------26
CHAPTER 4 Analysis-- -------------------------------------------30
4.1.Reliability and validity------------------------------------30
4.2.Regression model--------------------------------------------32
4.3.Test hypothesis and analysis--------------------------------35
CHAPTER 5 Conclusion--------------------------------------------38
Reference ------------------------------------------------------41
Appendix 1: Questionnaire --------------------------------------44

List of Figures

Figure 1-1 Research Process--------------------------------------2
Figure 2-1 Organization Culture within the Innovation Process----9
Figure 2-2 How a Semiconductor Chip is Made---------------------12
Figure 2-3 Moore’s Law-----------------------------------------14
Figure 2-4 Production ramp rate and density trends--------------14
Figure 2-5 Yield vs. Time Curves--------------------------------17
Figure.2-6 Detail of the idealized yield ramp curve-------------18
Figure 3-1 How the Innovative Culture Can Benefit a Company-----20
Figure 3-2 What Innovative Cultures are-------------------------21
Figure 3-3 Yield improvement flow-------------------------------24
Figure 3-4 Production ramp rate and defect density--------------24

List of Tables

Table 2-1 James R. Derter,2000; General dimensions of
          organization culture-----------------------------------5
Table 2-2 Types of Organizational Culture-----------------------10
Table 2-3 Emerging Manufacturing Needs -------------------------15
Table 3-1 Tolerate and Accept Failure---------------------------26
Table 3-2 Prevailing Spirit of Cooperation and Share------------27
Table 3-3 Stress Individual Equity------------------------------27
Table 3-4 Faith of Never Ending for Seeking Truth---------------28
Table 3-5 Accept Variety----------------------------------------28
Table 3-6 Sportsman Spirit--------------------------------------29
Table 3-7 Performance management--------------------------------29
Table 4-1 Reliability Analysis----------------------------------30
Table 4-2 Model Summary-----------------------------------------33
Table 4-3 Coefficients------------------------------------------33
Table 4-4 Descriptive Statistics in Company and Industry--------34
Table 4-5 Descriptive Statistics in Variables-------------------34

                                

1.Bode C.A., Sonderman T.J., Kittler R. and McIntyre M., "Addressing the Transition to 300mm Wafer Fabrication Through Automation," Global Semiconductor, to be published.
2.Brannen, Mary Yoko, “Culture as the Critical Factor in Implementing Innovation,” Business Horizons, November-December 1991, P59-67.
3.Chandler, Gaylen N., “Unraveling the Determiniants and Consequences of an Innovation-Supportive Organizational Culture,” Entreperneurship Theory and Practice, Fall 2000, P59-76.
4.Dahlgaard, Jens J, “Integrating Business Excellence and Innovation Management: Developing a Culture for Innovation, Creativity and Learning,” Total quality Management, June 1999, Vol: 10, Is: 4/5.
5.Davenport, Thomas H., “Successful Knowledge Management Projects,” Sloan Management Review, winter 1998, P43-57.
6.Dayton, “Building a Learning Organization at Coopers & Lybrand,” Planning Review, September-October 1994, P28-34.
7.Detert, James R., “A Framework for Linking Culture and Improvement Initiatives in Organizations,” Acdamady of Management Review, Vol. 25, No.4, P850-863.
8.Dougherty, Deborah, “The Effects of Organizational Downsizing on Product Innovation,” California Management Review, Summer 1995, P29-43.
9.Drucker, Peter F., “Breakthrough Thinking,” Harvard Business Review, November-December 1998, P96-105.
10.Drucker, Peter F., “The Discipline of Innovation,” Harvard Business Review, May-June 1985, P67-72.
11.Gruber, Harald, “The Learning Curve in The Production of Semiconductor Memory Chips,” Applied Economics, 1992, Vol. 24, P885-894.
12.Gruber, Harald, “The Yield Factor and The Learning Curve in Semiconductor Production,” Applied Economics, 1994, Col. 26, P837-843.
13.Hatch, Nile W., “Process Innovation and learning by Doing in Semiconductor Manufacturing,” Management Science, November 1998, P1461-1477.
14.Hauser, Markus, “Organizational Culture and Innovativeness of Firms – an Intergrative View,” Technology Management, Vol. 16, Nos. 1/2/3, 1998, P239-255.
15.Inglehart, Roland and Baker, Wayne E, “Modernization’s challenge to traditional values: Who’s afraid of Ronald McDonald? ” The Futurist; Washionton, Mar/Apr 2001, Vol: 35, Is: 2, p 16-21.
16.Jarvis R, Retersdorf M; Can technology keep pace with high aspect-ratio inspection?; Solid State Technology, November 2003
17.Johnson, Gerry, “Strategy Through a Culture Lens,” Management Learning, 2000, P403-426.
18.Kittler, R., "Challenges for Use of Statistical Software in the Semiconductor Industry," Proc. Joint Statistical Meetings, August 2000.
19.Leachman, R.C. and Berglund, C.N., "Systematic Mechanisms Limited Yield (SMLY) Assessment Study," SEMATECH Document #03034382A-ENG, March 31, 2003.
20.Lee, Fourmun, “Yield Management: Present and Future,” Semiconductor International, March 2000, P85-94.
21.Lin, Wei-shong, Competitive Strategy, Spring-Morn Co, Taipei, Taiwan, 2002.
22.Machor, Jeffrcy T, “Reversal of Fortune? The Recovery of U.S. Semiconductor Industry,” California Management Review, Vol. 41, IS. 1, P 107-136.
23.Mayo, “The Human Problems of an industrial Civilization,” 1933.
24.McDermott, Christopher M., “Organizational Culture and Advanced Manufacturing Technology Implementation,” Journal of Operations Management, 1999, P 521-533.
25.Moore, Gordon, Electronic Materials Symposium Santa Clara, CA, March 1998.
26.Next Generation Manufacturing: A Framework for Action,. Agility Forum, Bethlehem, PA, 1997.
27.Nonaka, “Creation Organizational Order Out of Chaos: Self-Renewal in Japanese Firms,” California Management Review, Spring 1998, P57-73.
28.Nonaka, “Knowledge-Creating Compnay,” Harvard Business Review, November-December 1991, P96-105.
29.Nonaka, “Redundant, Overlaping Organization: A Japanese Approach to Managing the Innovation Process,” California Management Review, spring 1990, P27-38.
30.Nonaka, “Redundant, Overlapping Organization: A Japanese Approach to Managing the Innovation Process,” California Management Review, Spring 1990, P57-73.
31.Nonaka, “The New Product Development Game,” Harvard Business Review, January-February 1986, P137-146.
32.Nonaka, “Toward a Self Organization Paradigm: Managing the Creation of Information,” Working Paper, Institute of Business Research, Hitotsubashi University, August 1985.
33.Nonaka, “Toward Middle-Up-Down Management:Accelerating Information Creation,” Sloan Management Review, Spring 1988, P9-18.
34.Nonoka, “Destruction and Creation of Organizational order: A Suggested Paradigm for Self-Organization,” Organizational Science, 20/1 (1986),[in Japanese].
35.Pisano, Gary P., “Managing Hi-Tech industry,” Harvard Business Review, September-October 1995, P96-105.
36.Quinn, James Brian, “Managing Innovation: Controlled Chaos,” Harvard Business Review, May-June, P 73-84.
37.Schein, “Innovative Cultures and Organizations,” 1990.
38.Scher, G.M., "Wafer Tracking Comes of Age," Semiconductor International, May 1991, p. 126.
39.Simon, H. A., ”Administrative Behavior,” 1945.
40.Taylor, Andrew, “Technology as knowledge - Toward a New Perspective on knowledge Management in Electronics,” Technology Management, 1996, P296-314.
41.The International Technology Roadmap for Semiconductors - 2003 Edition (San Jose: SIA, 2003)
42.Tobin KW, Karnowski TP, Lakhani F; Technology Considerations for Future Semiconductor Data Management Systems; Semiconductor FABTECH, 12th Edition, first 2000 issue.
43.Tushman, Michael L, “Ambidextrous Organizations: Management Evolutionary and Revolutionary Change,” California Management Review, Summer 1996, P8-23.
44.Walker H, Balachandran H, Lakhani F, Stanojevic Z, Jandhyala S, Saxena J, Butler K; Computer-Aided Fault to Defect Mapping (CAFDM) for Defect Diagnosis;IEEE International Test Conference, October 2000.

全文公開日期本全文未授權公開 (校外網路)
全文公開日期本全文未授權公開 (國家圖書館：臺灣博碩士論文系統)

簡易檢索 / 詳目顯示

相關論文