簡易檢索 / 詳目顯示

研究生: 嚴鈞懷
Chun-Huai Yen
論文名稱: 應用自動化光學檢測技術於感光元件之封裝級玻璃瑕疵辨識系統之開發與研究
Applying Automated Optical Inspection Technique on Packaging of Photosensitive Element and the Research and Development of a Glass Defect Identification System
指導教授: 黃昌群
Chang-Chiun Huang
郭中豐
Chung-Feng Jeffrey Kuo
口試委員: 張嘉德
Chia-Der Chang
學位類別: 碩士
Master
系所名稱: 工程學院 - 自動化及控制研究所
Graduate Institute of Automation and Control
論文出版年: 2013
畢業學年度: 101
語文別: 中文
論文頁數: 105
中文關鍵詞: 自動化光學檢測歐蘇門檻值決定法最大熵值法影像金字塔支持向量機
外文關鍵詞: automated optical inspection, Otsu threshold determination, maximum entropy, image pyramid, support vector machine
相關次數: 點閱:237下載:5
分享至:
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報
  • 本研究為智慧型感光元件之封裝級玻璃瑕疵檢測,主要設計開發一套自動化光學檢測系統。而本研究自行設計開發之硬體架構系統含括電荷耦合元件(charge coupled device, CCD)相機、X-Y-Z軸移動平台、光源調整器以及正、背光源。而系統之光源架構為,背光源加上偏光膜搭配正光源以突顯玻璃蓋片瑕疵特徵,其中,偏光膜主要是避免擷取之影像容易產生過曝,並結合CCD相機擷取玻璃蓋片影像,並以本研究自行提出之多層影像(multi-layer image)亮度校正方法,進行亮度校正,解決亮度不均之問題。運用影像金字塔降低影像資訊量及正規化相關係數法模板比對來進行玻璃之定位,並分別對封裝級玻璃之光阻區與非光阻區進行檢測,在光阻區利用歐蘇(Otsu)門檻值決定法,將封裝級玻璃之光阻,從影像中分割出來,並計算其光阻殘缺之面積。而非光阻區則分為高對比度瑕疵(亮點、暗點以及刮傷)與低對比度瑕疵(溶液殘留)進行檢測,高對比度瑕疵使用最大熵值法來進行瑕疵影像分割,而低對比度瑕疵則是先使用直方圖等化提高影像對比度,突顯其瑕疵特徵,再搭配最大熵值法來進行瑕疵影像分割,結合支持向量機來進行非光阻區瑕疵分類辨識(亮點、暗點、刮傷以及溶液殘留),最後,結合電腦人機控制介面、影像擷取設備、光源設備及電控系統,以達到感光元件之封裝級玻璃瑕疵檢測系統軟硬體整合之自動化檢測目的,本研究之自動化光學檢測能夠檢測出5um以下的瑕疵,且實驗結果顯示,瑕疵分類準確率98.97%,可滿足產業界自動化光學檢測系統上之需求


    This study developed an intelligent automated optical inspection system for packaging level glass defects of photosensitive elements. The light source in this study is consisted of back light source, polarizing film and positive light source, for highlighting the cover glass defect characteristic. The polarizing film avoids overexposure of the captured image, and the CCD camera captures the cover glass image. The image pyramid is used to reduce the image information content and normalize template matching of the correlation coefficient method to position the glass. The photoresist area and non-photoresist area of the packaging level glass are detected. In the photoresist area, the Otsu threshold determination is used to separate the photoresist of packaging level glass from the image, and the photoresist breakage area is calculated. In the non-photoresist area, the high-contrast defects (bright spot, dark spot and scratch) and low-contrast defect (solution residue) are detected. For the high-contrast defects, the maximum entropy is used for defect image segmentation. For the low-contrast defect, the histogram equalization is used to increase the image contrast to highlight the defect characteristic, and then the maximum entropy is used for defect image segmentation. The support vector machine is used for non-photoresist area defect classification identification (bright spot, dark spot, scratch and solution residue). Finally, the computer man-machine control interface, image capture equipment, light source equipment and electric control system are combined, so as to im-plement the software and hardware integrated automatic detection of the packaging level glass defect detection system for photosensitive elements. The automated optical inspection in this study can detect defects less than 5 um. The experimental results showed that the defect classification accuracy rate is 98.97%.

    目錄 致謝 I 摘要 II Abstract IV 目錄 VI 圖目錄 X 表目錄 XIII 第1章 緒論 1 1.1 研究背景 1 1.2 研究動機與目的 4 1.2.1 文獻回顧 6 1.2.2 自動化光學檢測系統 6 1.2.3 亮度校正 8 1.2.4 影像強化 9 1.2.5 分類器 11 1.3 論文架構 13 第2章 亮度校正 16 2.1 多層影像(MULTI-LAYER IMAGE)亮度校正 17 2.1.1 查找表(Look-up table, LUT) 17 2.1.2 多層影像亮度校正流程 17 2.1.3 線性亮度校正 21 2.1.4 亮度校正效果評比指標 23 2.1.5 亮度校正效能評比 24 第3章 研究方法相關理論 33 3.1 數位影像處理技術 33 3.1.1 數位影像表示方式 33 3.1.2 影像金字塔 34 3.1.3 模板比對 35 3.1.4 直方圖等化 36 3.1.5 影像分割 38 3.1.6 歐蘇(Otsu)門檻值法 41 3.1.7 最大熵值法 43 3.1.8 疊代法 44 3.2 形態學 45 3.2.1 連通物件標記法 45 3.2.2 侵蝕 47 3.2.3 膨脹 48 3.2.4 斷開與閉合 49 3.2.5 洞的填充 51 3.3 影像特徵 51 3.3.1 面積與周長 52 3.3.2 質心 53 3.3.3 長寬比 53 3.3.4 形狀複雜度 54 3.3.5 似圓性 54 3.3.6 平均灰階值 54 3.4 分類器理論 55 3.4.1 倒傳遞類神經網路 55 3.4.2 支持向量機 59 第4章 實驗機台規劃與方法驗證 65 4.1 影像擷取系統 65 4.2 實驗機台架構 67 4.3 電腦硬體設備與程式開發軟體 68 4.4 封裝級玻璃 69 4.1 瑕疵類型 71 4.1.1 光阻殘缺 71 4.1.2 亮點及暗點 72 4.1.3 刮傷 73 4.1.1 溶液殘留 73 4.1.2 瑕疵定義 74 4.2 亮度校正 75 4.3 影像定位 79 4.4 光阻區瑕疵檢測 82 4.5 非光阻區瑕疵檢測 83 4.5.1 高對比度瑕疵 83 4.5.2 低對比度瑕疵 87 4.6 瑕疵特徵分析 89 4.7 倒傳遞類神經網路與支持向量機瑕疵分類結果 93 第5章 結論與未來研究方向 97 5.1 結論 97 5.2 未來研究方向 98 參考文獻 100

    參考文獻
    [1] 米本和也,「CCD/CMOS 影像感測器之基礎與應用」,全華圖書股份有限公司,臺灣臺北,2006。
    [2] Boyle, W. S., and Smith, G. E., “Charge-Coupled Devices - a New Approach to Mis Device Structures”, IEEE spectrum, Vol. 8, No. 7, pp. 18-27, 1971.
    [3] Belbachir, A. N., Lera, M., Fanni, A., and Montisci, A., “An Automatic Optical Inspection System for the Diagnosis of Printed Circuits Based on Neural Networks”, Industry Applications Conference, Hong Kong, Vol. 1, pp. 680-684, 2005.
    [4] 陳宗達,「CMOS玻璃蓋片自動光學檢測機台之設計及開發」,國立交通大學,工業工程及管理研究所,碩士論文,2005。
    [5] Chang, C. Y., Chang, C. H., Li, C. H., and Jeng, M. D., “Learning Vector Quantization Neural Networks for Led Wafer Defect Inspection”, International Journal of Innovative Computing, Information and Control, Vol. 4, No. 10, pp. 2565-2579, 2008.
    [6] Chen, L. F., Su, C. T., and Chen, M. H., “A Neural-Network Ap-proach for Defect Recognition in TFT-LCD Photolithography Process”, IEEE Transactions on Electronics Packaging Manufacturing, Vol. 32, No. 1, pp. 1-8, 2009.
    [7] Francesco, A., Filippo, A., and Attilio, D. N., “Calibration of an Inspection System for Online Quality Control of Satin Glass”, IEEE Transactions on Instrumentation and Measurement, Vol. 59, No. 5, pp. 1035-1046, 2010.
    [8] Stockham, T. G. Jr., “Image Processing in the Context of a Visual Model”, Proceedings of the IEEE, Vol. 60, No. 7, pp. 828-842, 1972.
    [9] Wang, M., Pan, J., Chen, S., and Li, H., “A Method of Removing the Uneven Illumination Phenomenon for Optical Remote Sensing Image”, Geoscience and Remote Sensing Symposium, Vol. 5, Korea, 2005.
    [10] 張紀鈴、馮曉毅、夏超,「AOI檢測系統光照不均的校正方法研究」,電子量測技術 (Eletronic Measurement Tech-nology),第七期,第三十卷,pp.20-23,2007。
    [11] Kim, T. Y., “Contrast Enhancement Using Brightness Preserving Bi-Histogram Equalization”, IEEE Transactions on Consumer Electronics, Vol. 3, No. 1, pp. 1-8, 1997.
    [12] Kim, J. Y., Kim, L. S., and Hwang, S. H., “An Advanced Contrast Enhancement Using Partially Overlapped Sub-Block Histogram Equalization”, IEEE Transactions on Circuits and Systems for Video Technology, Vol. 11, No. 4, pp. 475-484, 2001.
    [13] Wang, C., and Ye, Z., “Brightness Preserving Histogram Equalization with Maximum Entropy: A Variational Perspective”, IEEE Transactions on Consumer Electronics, Vol. 51, No. 4, pp. 1326-1334, 2005.
    [14] 李界磐,「以影像亮度為基礎之適應性影像增強法的研究」,國立台灣科技大學,電機工程學系,碩士論文,2007。
    [15] Turgay, C., and Tardi, T., “Automatic Image Equalization and Contrast Enhancement Using Gaussian Mixture Modeling”, IEEE Transactions on Image Processing, Vol. 21, No. 1, pp. 145-156, 2012.
    [16] Hasikin, K., and Isa, N. A. M., “Enhancement of the Low Contrast Image Using Fuzzy Set Theory”, 2012 UKSim 14th International Conference on Computer Modelling and Simulation (UKSim), pp. 371-376, Cambridge, United Kingdom, 2012.
    [17] Chen, F. L., and Liu, S. F.,“A Neural-Network Approach to Recognize Defect Spatial Pattern in Semiconductor Fabrication”, IEEE Transactions on Semiconductor Manufacturing, Vol. 13, No. 3, pp. 366-373, 2000.
    [18] Feng, H., Ye, J., and Pease, R. F., “Self Inspection of Integrated Circuits Pattern Defects Using Support Vector Machines”, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 23, No. 6, pp. 3085-3089, 2005.
    [19] Acciani, G., Brunetti, G., and Fornarelli, G., “Application of Neural Networks in Optical Inspection and Classification of Solder Joints in Surface Mount Technology”, IEEE Transactions on Industrial Informatics, Vol. 2, No. 3, pp. 200-209, 2006.
    [20] Chang, C. Y., Li, C. H., Lin, S. Y., and Jeng, M.,“Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection”, IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews, Vol. 39, No. 3, pp. 352-365, 2009.
    [21] Duan, G., Wang, H., Liu, Z., and Chen, Y. W., “A Machine Learning-Based Framework for Automatic Visual Inspection of Microdrill Bits in PCB Production”, IEEE Transactions on Sys-tems, Man, and Cybernetics, Part C: Applications and Reviews, Vol. 42, No. 6, pp. 1679-1689, 2012.
    [22] Wu, H., Zhang, X., Xie, H., Kuang, Y., and Ouyang, G., “ Classification of Solder Joint Using Feature Selection Based on Bayes and Support Vector Machine”, IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 3, No. 3, pp. 516-522, 2013.
    [23] Kelly, M. C., Croarken, M., Flood, R., and Robson, E., “The History of Mathematical Tables”, Oxford University Press, New York, USA, 2003.
    [24] 鍾國亮,「影像處理與電腦視覺(第四版)」,東華書局,臺灣台北,2008。
    [25] Gonzalez, R. G., and Woods, R. E., “Digital Image Processing 3rd Edition”, Prentice Hall, Taiwan, Taipei, 2008.
    [26] Tanimoto, S. L., “Template Matching in Pyramids”, Computer Graphics and Image Processing, Vol. 16, No. 4, pp. 356-369, 1981.
    [27] Tsai, D. M., and Lin, C. T., “Fast Normalized Cross Correlation for Defect Detection”, Pattern Recognition Letters, Vol. 24, No. 15, pp. 2625-2631, 2003.
    [28] Mattoccia, S., Tombari, F. Di., and Stefano, L., “Fast Full-Search Equivalent Template Matching by Enhanced Bounded Correlation”, IEEE Transactions on Image Processing, Vol. 17, No. 4, pp. 528-538, 2008.
    [29] Otsu, N., “A Threshold Selection Method from Gray Level Histogram”, IEEE Transactions on Systems, Man, and Cybernetics, Vol. 9, No. 1, pp. 62-66, 1979.
    [30] Kapur, J. N., Sahoo, P. K., and Wong, A. K. C., “A New Method for Gray-Level Picture Thresholding Using the Entropy of the Histogram”, Computer Vision, Graphics, and Image Processing, Vol. 29, pp. 273-285, 1985.
    [31] Ridler, T. W., and Calvard, S., “Picture Thresholding Using an Iterative Selection Method”, IEEE Transactions on Systems, Man, and Cybernetics, Vol. 8, No. 8, pp. 630-632, 1978.
    [32] 蘇春木、張孝德,「機器學習:類神經網路、模糊系統以及基因演算法則」,全華圖書股份有限公司,臺灣臺北,2007。
    [33] Rumelart, D. E., Hinton, G. E., and Williams, R. J., “Learning Representations by Back-Propagating Errors”, Nature, Vol. 323, No. 9, pp. 533-536, 1986.
    [34] Cortes, C., and Vapnik, V., “Support-Vector Network”, Machine Learning, Vol. 20, No. 3, pp. 273-297, 1995.
    [35] Vapnik, V. N., “The Nature of Statistical Learning Theory”, Springer-Verlag New York, Inc., New York, USA, 1995.
    [36] Vapnik, V. N., “Statistical Learning Theory”, John Wiley & Sons, Inc., New York, 1998.
    [37] Bellman, R., “Dynamic Programming and Lagrange Multipliers”, Proceedings of the National Academy of Sciences of the United States of America, Vol. 42, No. 10, pp. 767-769, 1956.
    [38] 陳建堂,「偏光膜外觀瑕疵之影像檢測系統開發」,國立台灣科技大學,高分子系,碩士論文,2008。
    [39] 葉怡成,「類神經網路模式應用與實作」,儒林書局,臺灣台北,2003。
    [40] 羅華強,類神經網路-MATLAB的應用,高立圖書股份有限公司,臺灣台北,2005。
    [41] 連國珍,數位影像處理MATLAB,儒林圖書公司,臺灣台北,2007。

    QR CODE